公开(公告)号：US10992293B2

公开(公告)日：2021-04-27

申请号：US16137146

申请日：2018-09-20

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Xiong Li ,  William Toth ,  Honglin Guo ,  Danyang Zhu

IPC: H03K17/08 ,  H03K17/081

Abstract: A device that comprises a first semiconductor die and a second semiconductor die. The first semiconductor die comprises a first clock signal generator. The second semiconductor die comprises a fault detection circuit, the fault detection circuit comprising a second clock signal generator, a first counter coupled to the second clock signal generator, multiple storage devices coupled to the second clock signal generator and to the first counter, a logic gate coupled to the multiple storage devices, a second counter coupled to the logic gate and to the first clock signal generator, and a comparator coupled to the logic gate and the second counter.