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公开(公告)号:US20220157509A1
公开(公告)日:2022-05-19
申请号:US17477540
申请日:2021-09-17
申请人: TMY Technology Inc.
发明人: Yang Tai , Shun-Chung Kuo , Wen-Tsai Tsai , Jiun-Wei Wu , Yu-Lin Lee
IPC分类号: H01F27/28
摘要: The disclosure provides a coplanar inductor, which includes a first spiral arm, a second spiral arm and a conductive patch. The first spiral arm has a first end and a second end, wherein the first spiral arm spirally extends from the first end of the first spiral arm toward the second end of the first spiral arm from inside to outside. The second spiral arm has a first end and a second end. The second spiral arm extends spirally from the first end of the second spiral arm toward the second end of the second spiral arm from inside to outside. The first end of the second spiral arm is coupled to the first end of the first spiral arm through the conductive patch, and the first spiral arm and the second spiral arm are coplanar.
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公开(公告)号:US11205827B2
公开(公告)日:2021-12-21
申请号:US16993348
申请日:2020-08-14
申请人: TMY Technology Inc.
发明人: Su-Wei Chang , Chueh-Jen Lin , Wen-Tsai Tsai , Shun-Chung Kuo , Yang Tai , Wei-Yang Chen , Chien-Tse Fang , Po-Chia Huang , Jiun-Wei Wu , Yu-Cheng Lin , Shao-Chun Hsu
IPC分类号: H01Q1/22 , H01Q13/02 , H01P3/12 , H04B17/29 , H01P3/08 , H01Q3/26 , H01Q21/00 , H01Q19/185 , H01Q21/29 , H04B17/00
摘要: Provided is a rapid over-the-air (OTA) production line test platform, including a device under test (DUT), an antenna array and two reflecting plates. The DUT has a beamforming function. The antenna array is arranged opposite to the DUT, and emits beams with beamforming. Two reflecting plates are disposed opposite to each other, and are arranged between the DUT and the antenna array. The beam OTA test of the DUT is carried out by propagation of the beams between the antenna array, the DUT and the two reflecting plates. Accordingly, the test time can be greatly shortened and the cost of test can be effectively reduced. In addition to the above-mentioned rapid OTA production line test platform, platforms for performing the OTA production line test by using horn antenna arrays together with bending waveguides and using a 3D elliptic curve are also provided.
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公开(公告)号:US11600894B2
公开(公告)日:2023-03-07
申请号:US17500928
申请日:2021-10-13
申请人: TMY Technology Inc.
发明人: Su-Wei Chang , Chueh-Jen Lin , Wen-Tsai Tsai , Shun-Chung Kuo , Yang Tai , Wei-Yang Chen , Chien-Tse Fang , Po-Chia Huang , Jiun-Wei Wu , Yu-Cheng Lin , Shao-Chun Hsu
IPC分类号: H04B17/29 , H01Q1/22 , H01Q21/06 , H04B17/15 , H01P5/02 , H01P3/08 , H01Q13/02 , H01Q19/185 , H01Q21/29 , H04B17/00 , G01R31/28
摘要: Provided is a rapid over-the-air (OTA) production line test platform, including a device under test (DUT), an antenna array and two reflecting plates. The DUT has a beamforming function. The antenna array is arranged opposite to the DUT, and emits beams with beamforming. Two reflecting plates are disposed opposite to each other, and are arranged between the DUT and the antenna array. The beam OTA test of the DUT is carried out by propagation of the beams between the antenna array, the DUT and the two reflecting plates. Accordingly, the test time can be greatly shortened and the cost of test can be effectively reduced. In addition to the above-mentioned rapid OTA production line test platform, platforms for performing the OTA production line test by using horn antenna arrays together with bending waveguides and using a 3D elliptic curve are also provided.
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公开(公告)号:US11316240B2
公开(公告)日:2022-04-26
申请号:US16992170
申请日:2020-08-13
申请人: TMY Technology Inc.
发明人: Su-Wei Chang , Chueh-Jen Lin , Wen-Tsai Tsai , Tzu-Chieh Hung , Yang Tai , Chien-Tse Fang , Po-Chia Huang , Tzu-Wen Chiang , Shao-Chun Hsu , Yu-Cheng Lin , Wei-Yang Chen
IPC分类号: H01P5/02 , H01P3/08 , H01Q1/22 , H01Q3/26 , H01Q21/00 , H01Q13/02 , H01Q19/185 , H01Q21/29 , H04B17/00
摘要: A transition structure for millimeter wave is provided. The transition structure includes a first layer signal element coupled to an end of a first transmission line and a plurality of first layer ground elements surrounding the end of the first transmission line equidistantly from the end of the first transmission line and disposed along two opposite sides of a strip body of the first transmission line equidistantly from the strip body of the first transmission line. The transition structure further includes an intermediate layer signal element coupled to the first layer signal element and a plurality of intermediate layer ground elements surrounding the intermediate layer signal element quasi-coaxially. A multilayer transition structure including a multilayer structure and the transition structure is also provided. Therefore, the problem of operating frequency caused by the thickness of the multilayer structure can be overcome, thereby increasing the resonance frequency of the multilayer structure.
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公开(公告)号:US20210050674A1
公开(公告)日:2021-02-18
申请号:US16993351
申请日:2020-08-14
申请人: TMY Technology Inc.
发明人: Su-Wei Chang , Chueh-Jen Lin , Wen-Tsai Tsai , Tzu-Chieh Hung , Yang Tai , Chien-Tse Fang , Po-Chia Huang , Te-Liang Sun , Ying-Yen Lu
摘要: An antennas-in-package (AiP) verification board is provided, which includes a carrier board configured for disposing an antenna array or an electronic circuit; and a plurality of SMPM connectors. The plurality of SMPM connectors are arranged in an array on the carrier board and electrically connected with the antenna array or the electronic circuit of the carrier board for testing the characteristics of the antenna array on the carrier board or the characteristics of the electronic circuit on the carrier board. The AiP verification board is fixed on a beamforming test platform. In addition to the aforementioned AiP verification board, an AiP verification board including a plurality of adaptor structures and an AiP verification board including a plurality of connectors and a plurality of adaptor structures are also provided.
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公开(公告)号:US12107336B2
公开(公告)日:2024-10-01
申请号:US17474069
申请日:2021-09-14
申请人: TMY Technology Inc.
发明人: Yang Tai , Shun-Chung Kuo , Wen-Tsai Tsai , An-Ting Hsiao , Wei-Yang Chen , Jiun-Wei Wu
CPC分类号: H01Q21/065 , H01Q9/0421 , H01Q21/24
摘要: A broadband linear polarization antenna structure, including a reference conductive layer, a first patch antenna, a second patch antenna, and a feeding portion, is provided. The reference conductive layer includes through holes. A first short pin is connected between the reference conductive layer and the first patch antenna, and a second short pin is connected between the first patch antenna and the second patch antenna. Each feeding portion penetrates the reference conductive layer through the through hole and is coupled to the first patch antenna.
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公开(公告)号:US20220158353A1
公开(公告)日:2022-05-19
申请号:US17485539
申请日:2021-09-27
申请人: TMY Technology Inc.
发明人: Yang Tai , Shun-Chung Kuo , Wen-Tsai Tsai , Jiun-Wei Wu , Shao-Chun Hsu
摘要: The disclosure provides an ultra-wideband non-metal horn antenna, which includes three combinable non-metal elements such as an impedance matching member, a field adjustment member and an outer cover member. The impedance matching member and the field adjustment member are respectively disposed with a first and second groove structures. The field adjustment member is connected between the impedance matching member and the outer cover member. Therefore, the horn antenna of the disclosure can have a more symmetrical radiation pattern, a smaller antenna size, and ultra-wideband performance.
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公开(公告)号:US20220069428A1
公开(公告)日:2022-03-03
申请号:US17500928
申请日:2021-10-13
申请人: TMY Technology Inc.
发明人: Su-Wei Chang , Chueh-Jen Lin , Wen-Tsai Tsai , Shun-Chung Kuo , Yang Tai , Wei-Yang Chen , Chien-Tse Fang , Po-Chia Huang , Jiun-Wei Wu , Yu-Cheng Lin , Shao-Chun Hsu
摘要: Provided is a rapid over-the-air (OTA) production line test platform, including a device under test (DUT), an antenna array and two reflecting plates. The DUT has a beamforming function. The antenna array is arranged opposite to the DUT, and emits beams with beamforming. Two reflecting plates are disposed opposite to each other, and are arranged between the DUT and the antenna array. The beam OTA test of the DUT is carried out by propagation of the beams between the antenna array, the DUT and the two reflecting plates. Accordingly, the test time can be greatly shortened and the cost of test can be effectively reduced. In addition to the above-mentioned rapid OTA production line test platform, platforms for performing the OTA production line test by using horn antenna arrays together with bending waveguides and using a 3D elliptic curve are also provided.
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公开(公告)号:US20210050923A1
公开(公告)日:2021-02-18
申请号:US16993348
申请日:2020-08-14
申请人: TMY Technology Inc.
发明人: Su-Wei Chang , Chueh-Jen Lin , Wen-Tsai Tsai , Shun-Chung Kuo , Yang Tai , Wei-Yang Chen , Chien-Tse Fang , Po-Chia Huang , Jiun-Wei Wu , Yu-Cheng Lin
IPC分类号: H04B17/00 , H01Q19/185 , H01Q21/29 , H01Q13/02
摘要: Provided is a rapid over-the-air (OTA) production line test platform, including a device under test (DUT), an antenna array and two reflecting plates. The DUT has a beamforming function. The antenna array is arranged opposite to the DUT, and emits beams with beamforming. Two reflecting plates are disposed opposite to each other, and are arranged between the DUT and the antenna array. The beam OTA test of the DUT is carried out by propagation of the beams between the antenna array, the DUT and the two reflecting plates. Accordingly, the test time can be greatly shortened and the cost of test can be effectively reduced. In addition to the above-mentioned rapid OTA production line test platform, platforms for performing the OTA production line test by using horn antenna arrays together with bending waveguides and using a 3D elliptic curve are also provided.
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公开(公告)号:US11575208B2
公开(公告)日:2023-02-07
申请号:US17485539
申请日:2021-09-27
申请人: TMY Technology Inc.
发明人: Yang Tai , Shun-Chung Kuo , Wen-Tsai Tsai , Jiun-Wei Wu , Shao-Chun Hsu
摘要: The disclosure provides an ultra-wideband non-metal horn antenna, which includes three combinable non-metal elements such as an impedance matching member, a field adjustment member and an outer cover member. The impedance matching member and the field adjustment member are respectively disposed with a first and second groove structures. The field adjustment member is connected between the impedance matching member and the outer cover member. Therefore, the horn antenna of the disclosure can have a more symmetrical radiation pattern, a smaller antenna size, and ultra-wideband performance.
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