公开(公告)号：US20200041626A1

公开(公告)日：2020-02-06

申请号：US16524330

申请日：2019-07-29

Applicant: TOPCON Corporation

Inventor： Ken-ichiro Yoshino ,  Taizo Eno ,  Hideki Morita ,  Kohei Fujita

IPC: G01S7/499 ,  G01S7/481 ,  G01S17/42 ,  G01S7/48

Abstract: A surveying instrument comprises a projection optical system for irradiating a distance measuring light which is a linearly-polarized light to an object to be measured, a light receiving optical system for receiving a reflected distance measuring light from the object to be measured, a polarization selecting module for selecting a polarization of the reflected distance measuring light received by the light receiving optical system and an arithmetic control module for controlling a distance measurement based on a light receiving result of the reflected distance measuring light, wherein the arithmetic control module is configured to give a material information to a distance measurement result of the object to be measured based on a change in light receiving amounts caused due to a selection of the polarization by the polarization selecting module.

公开(公告)号：US11435457B2

公开(公告)日：2022-09-06

申请号：US16524330

申请日：2019-07-29

Applicant: TOPCON Corporation

Inventor： Ken-ichiro Yoshino ,  Taizo Eno ,  Hideki Morita ,  Kohei Fujita

IPC: G01S7/499 ,  G01S7/48 ,  G01S17/42 ,  G01S7/481

Abstract: A surveying instrument comprises a projection optical system for irradiating a distance measuring light which is a linearly-polarized light to an object to be measured, a light receiving optical system for receiving a reflected distance measuring light from the object to be measured, a polarization selecting module for selecting a polarization of the reflected distance measuring light received by the light receiving optical system and an arithmetic control module for controlling a distance measurement based on a light receiving result of the reflected distance measuring light, wherein the arithmetic control module is configured to give a material information to a distance measurement result of the object to be measured based on a change in light receiving amounts caused due to a selection of the polarization by the polarization selecting module.