公开(公告)号：US20170131728A1

公开(公告)日：2017-05-11

申请号：US15318623

申请日：2015-06-09

Applicant: TOPNIR SYSTEMS SAS

Inventor： Didier LAMBERT ,  Claude SAINT MARTIN ,  Miguel SANCHEZ ,  Bernard RIBERO ,  Marc VALLEUR

IPC: G05D11/13 ,  G01N23/223 ,  G01N21/359 ,  G01N33/22

CPC classification number: G01N33/2829 ,  G01N21/33 ,  G01N21/35 ,  G01N21/359 ,  G01N21/65 ,  G01N23/223 ,  G01N24/082 ,  G01N33/22 ,  G01N35/00 ,  G01N2035/00465 ,  G01N2201/12 ,  G01N2223/304 ,  G01N2223/637 ,  G05D11/135 ,  G05D11/139

Abstract: The invention relates to a method and a device for certifying and optimizing a mixture of components in order to obtain a target product by spectral analysis, preferably by (topological) spectral analysis in the near infra-red (“NIR”).