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    RADIATION DETECTING DEVICE AND MEDICAL IMAGING DEVICE
    1.
    发明申请
    RADIATION DETECTING DEVICE AND MEDICAL IMAGING DEVICE 审中-公开

    公开(公告)号：US20180206805A1

    公开(公告)日：2018-07-26

    申请号：US15746482

    申请日：2016-08-01

    申请人： HITACHI, LTD.

    发明人： Masafumi ONOUCHI

    IPC分类号： A61B6/00 ,  A61B6/03 ,  G06T11/00 ,  G01T1/24

    CPC分类号： A61B6/4241 ,  A61B6/032 ,  A61B6/40 ,  A61B6/4233 ,  A61B6/463 ,  A61B6/54 ,  G01N23/046 ,  G01N2223/304 ,  G01T1/17 ,  G01T1/247 ,  G06T11/003

    摘要： There is provided a configuration that allows implementation of both photon measurement and current measurement with practical measuring performance and circuit area, where a plurality of detector elements constituting one detector pixel are connected to photon measuring circuits on a one-to-one basis, thereby counting current pulse signals outputted from the detector elements, and a current measuring unit incorporates an integrator, an adder, and a sample-hold circuit provided for every detector pixel, and a converter for converting analogue signals to digital signals, one converter being provided for a plurality of detector pixels. The integrator integrates and the adder adds current pulse signals respectively outputted from the plurality of detector elements constituting one detector pixel, the sample-hold circuit integrates outputs from the adder, and the converter selectively converts analogue outputs from the integration circuit of any of the plurality of detector pixels.

    OBJECT INFORMATION ACQUISITION METHOD AND OBJECT INFORMATION ACQUISITION APPARATUS
    2.
    发明申请
    OBJECT INFORMATION ACQUISITION METHOD AND OBJECT INFORMATION ACQUISITION APPARATUS 审中-公开

    公开(公告)号：US20170146468A1

    公开(公告)日：2017-05-25

    申请号：US15312751

    申请日：2015-06-02

    申请人： CANON KABUSHIKI KAISHA

    发明人： Taihei Mukaide

    IPC分类号： G01N23/083 ,  G01N23/207 ,  G01N23/04

    CPC分类号： G01N23/083 ,  G01N23/046 ,  G01N23/207 ,  G01N2223/304 ,  G01N2223/419

    摘要： Provided is a method for acquiring information relating to a composition of a detected object from results of a measurement, using radiation, this method including: a step for acquiring by a computer a result of measuring the detected object using radiation; a step for estimating by a computer a chemical composition ratio of the detected object, using an equation that contains a value derived from the measurement result as a constant and contains a value derived from the chemical composition ratio of the detected object as a variable, and then solving the equation; and a step for outputting the estimated chemical composition ratio or a physical property value acquired based on the estimated chemical composition ratio as information relating to the composition of the detected object.

    Method for measuring the mass thickness of a target sample for electron microscopy
    6.
    发明授权
    Method for measuring the mass thickness of a target sample for electron microscopy 有权

    公开(公告)号：US10054557B2

    公开(公告)日：2018-08-21

    申请号：US15329902

    申请日：2015-07-29

    申请人： Oxford Instruments Nanotechnology Tools Limited

    发明人： Peter Statham

    IPC分类号： H01J37/26 ,  G01N23/2252

    CPC分类号： G01N23/2252 ,  G01N2223/304 ,  G01N2223/633 ,  H01J37/261 ,  H01J2237/24578

    摘要： A method is provided of measuring the mass thickness of a target sample for use in electron microscopy. Reference data are obtained which is representative of the X-rays (28) generated within a reference sample (12) when a particle beam (7) is caused to impinge upon a region (14) of the reference sample (12). The region (14) is of a predetermined thickness of less than 300 nm and has a predetermined composition. The particle beam (7) is caused to impinge upon a region (18) of the target sample (16). The resulting X-rays (29) generated within the target sample (16) are monitored (27) so as to produce monitored data. Output data are then calculated based upon the monitored data and the reference data, the output data including the mass thickness of the region (18) of the target sample (16).

    X-RAY COMPUTED TOMOGRAPHY APPARATUS AND X-RAY DETECTOR
    10.
    发明申请
    X-RAY COMPUTED TOMOGRAPHY APPARATUS AND X-RAY DETECTOR 有权
    X射线计算机测图仪和X射线探测器

    公开(公告)号：US20160219686A1

    公开(公告)日：2016-07-28

    申请号：US14994809

    申请日：2016-01-13

    申请人： KABUSHIKI KAISHA TOSHIBA ,  Toshiba Medical Systems Corporation

    发明人： Michito NAKAYAMA ,  Atsushi HASHIMOTO ,  Tomoe SAGOH ,  Takaya UMEHARA ,  Shuya NAMBU ,  Koichi MIYAMA ,  Takashi KANEMARU ,  Keiji MATSUDA ,  Machiko ISO

    IPC分类号： H05G1/56

    CPC分类号： G01T1/2985 ,  A61B6/032 ,  A61B6/42 ,  G01N23/046 ,  G01N2223/304 ,  G01T1/17

    摘要： According to one embodiment, the X-ray computed tomography apparatus includes an X-ray tube, a rotating frame, a plurality of detector elements, a plurality of DAS elements, switching circuitry, and switching control circuitry. The X-ray tube generates X-rays. The X-ray tube is attached to the rotating frame. The plurality of detector elements detect X-rays. The plurality of DAS elements perform signal processing on output signals from the plurality of detector elements. The switching circuitry is provided between the plurality of detector elements and the plurality of DAS elements. The switching control circuitry controls the switching circuitry to switch the connections between the plurality of detector elements and the plurality of DAS elements for every rotation of the rotating frame at a predetermined angle.

    摘要翻译： 根据一个实施例，X射线计算机断层摄影装置包括X射线管，旋转框架，多个检测器元件，多个DAS元件，开关电路和开关控制电路。 X射线管产生X射线。 X射线管安装在旋转框架上。 多个检测器元件检测X射线。 多个DAS元件对来自多个检测器元件的输出信号执行信号处理。 开关电路设置在多个检测器元件和多个DAS元件之间。 开关控制电路控制开关电路以预定角度切换旋转框架的每次旋转的多个检测器元件和多个DAS元件之间的连接。