LIGHT CONTROL SHEET AND LIGHT CONTROL DEVICE

    公开(公告)号:US20230413405A1

    公开(公告)日:2023-12-21

    申请号:US18459478

    申请日:2023-09-01

    Applicant: TOPPAN Inc.

    Inventor: Yusuke TAKAHASHI

    CPC classification number: H05B47/105 H05B47/17

    Abstract: Thicknesses of a light control layer in measurement positions are within the range of 0.8 times to 1.2 times the median value of the thicknesses. In a characteristic curve obtained by measuring a change of a linear transmittance of visible light when a drive voltage applied to transparent electrode layers is changed, first voltage is a lower limit drive voltage in the range in which a change ratio of a linear transmittance is 0.5%/V or more, second voltage is an upper limit drive voltage, and a middle value is between the first voltage and the second voltage. The variance in the middle value is 35.0% or less. The variance is obtained by dividing a difference between the minimum value and the maximum value of middle values obtained from the characteristic curves of the measurement positions, by an average value of the middle values.

    TRANSPARENT SUBSTRATE FOR LIQUID CRYSTAL DEVICE AND LIGHT CONTROL SHEET

    公开(公告)号:US20240061291A1

    公开(公告)日:2024-02-22

    申请号:US18487433

    申请日:2023-10-16

    Applicant: TOPPAN Inc.

    CPC classification number: G02F1/133711 G02F2201/50

    Abstract: A transparent substrate for a liquid crystal device includes an alignment layer that regulates an alignment direction of liquid crystal molecules contained in a light control layer included in a light control sheet, which is the liquid crystal device, and a base layer on which the alignment layer is formed. The substrate includes a first surface and a second surface opposite to the first surface. The first surface is part of the alignment layer. The second surface is part of the base layer. A surface, which contacts the alignment layer, of the base layer has surface roughness Ra1 of 20 nm or less in a pencil hardness test. A sum Ra1+Ra2 of the surface roughness Ra1 and surface roughness Ra2 of the second surface is 5 nm or more.

    TRANSPARENT SUBSTRATE FOR LIQUID CRYSTAL DEVICE, AND LIGHT CONTROL SHEET

    公开(公告)号:US20240077766A1

    公开(公告)日:2024-03-07

    申请号:US18490107

    申请日:2023-10-19

    Applicant: TOPPAN Inc.

    CPC classification number: G02F1/133788 G02F1/133784

    Abstract: A transparent substrate for a liquid crystal device includes an alignment layer that regulates an alignment direction of liquid crystal molecules contained in a liquid crystal layer of the liquid crystal device, and a base layer on which the alignment layer is formed. The transparent substrate includes a first surface and a second surface opposite the first surface. The first surface is a surface of the alignment layer, and the second surface is a surface of the base layer. The coefficient of static friction between the first surface and the second surface is less than or equal to 1.3. The transparent substrate has a hardness of F or higher in a pencil harness test on the first surface or on a surface of the base layer opposite the second surface.

    LIGHT CONTROL SHEET AND LIGHT CONTROL DEVICE

    公开(公告)号:US20230408884A1

    公开(公告)日:2023-12-21

    申请号:US18459464

    申请日:2023-09-01

    Applicant: TOPPAN Inc.

    Inventor: Yusuke TAKAHASHI

    CPC classification number: G02F1/169

    Abstract: Thicknesses of a light control layer measured in multiple measurement positions are within the range of 0.8 times to 1.2 times the median value of the thicknesses. In a characteristic curve obtained by measuring a change in haze when a drive voltage applied to transparent electrode layers is changed, a first voltage is a lower limit drive voltage in the range in which the change ratio in haze is 0.5%/V or more, a second voltage is the upper limit drive voltage, and the middle value is a value between the first voltage and the second voltage. The variance in the middle value is 40% or less, in which the variance is obtained by dividing a difference between the minimum value and the maximum value, among middle values obtained from the characteristic curves in multiple measurement positions, by an average value of the middle values.

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