公开(公告)号：US20130002281A1

公开(公告)日：2013-01-03

申请号：US13634025

申请日：2011-03-14

申请人： Takahiro Motegi ,  Akihiro Matsui ,  Koji Ishikawa

发明人： Takahiro Motegi ,  Akihiro Matsui ,  Koji Ishikawa

IPC分类号： G01R1/067

CPC分类号： G01R1/0466 ,  H01R13/2435 ,  H01R13/2442

摘要： A contact probe having a substantially flat plate shape, used to connect different substrates and having a uniform plate thickness includes: a first contact portion which has a side surface curved in an arc shape and which makes contact with one substrate at the side surface thereof; a second contact portion which has a side surface curved in an arc shape and which makes contact with the other substrate at the side surface thereof; a connection portion which connects the first contact portion and the second contact portion; and an elastic portion which extends from the second contact portion, has a portion curved in an arc shape, and is elastically deformed by a load applied to the first contact portion and the second contact portion.

摘要翻译： 具有大致平板形状的接触探针，用于连接不同的基板并具有均匀的板厚，包括：第一接触部分，其具有弧形弯曲的侧表面，并在其侧表面与一个基板接触; 第二接触部，其具有弯曲成圆弧状的侧面，并且在侧面与另一个基板接触; 连接部，其连接所述第一接触部和所述第二接触部; 并且从第二接触部分延伸的弹性部分具有弯曲成弧形的部分，并且由施加到第一接触部分和第二接触部分的负载弹性变形。