公开(公告)号：US08390815B2

公开(公告)日：2013-03-05

申请号：US12667184

申请日：2008-03-14

申请人： Takayuki Saito ,  Toshiyuki Sanada ,  Yusuke Ozawa

发明人： Takayuki Saito ,  Toshiyuki Sanada ,  Yusuke Ozawa

IPC分类号： G01N21/55

CPC分类号： G01N13/02 ,  G01N21/431

摘要： Low-cost interface property measuring device and method enabling high-precision and simple measurement of an interface property. The interface property measuring device comprises an optical fiber probe (1) having a first end face (2) at least part of which is inclined with respect to a direction perpendicular to a fiber axis, a light supply (24) for supplying light from a second end face on the side opposite to the first end face of the optical fiber probe, a reflected light amount measuring device (24) for measuring the reflected light amount and a moving mechanism (18) for moving at least one of the optical fiber probe and an object (21) to be measured such that the first end face of the optical fiber probe passes through an interface (23) of the object (21) at a constant speed, and the interface property measuring device acquires the interface property of the object to be measured according to the result of measurement of the reflected light amount when the first end face of the optical fiber probe passes through the interface of the object to be measured.

摘要翻译： 低成本接口属性测量装置和方法能够实现高精度和简单的测量接口性能。 所述界面性质测量装置包括：光纤探针（1），其具有至少一部分相对于与光纤轴垂直的方向倾斜的第一端面（2）;用于从 第二端面与光纤探针的第一端面相对的一侧，用于测量反射光量的反射光量测量装置（24）和用于移动光纤探针中的至少一个的移动机构（18） 和测量对象（21），使得光纤探针的第一端面以恒定速度穿过物体（21）的界面（23），并且界面性质测量装置获取 当光纤探针的第一端面通过被测量物体的界面时，根据反射光量的测量结果来测量的物体。

公开(公告)号：US20100188662A1

公开(公告)日：2010-07-29

申请号：US12667184

申请日：2008-03-14

申请人： Takayuki Saito ,  Toshiyuki Sanada ,  Yusuke Ozawa

发明人： Takayuki Saito ,  Toshiyuki Sanada ,  Yusuke Ozawa

IPC分类号： G01N21/55

CPC分类号： G01N13/02 ,  G01N21/431

摘要： Low-cost interface property measuring device and method enabling high-precision and simple measurement of an interface property. The interface property measuring device comprises an optical fiber probe (1) having a first end face (2) at least part of which is inclined with respect to a direction perpendicular to a fiber axis, a light supplying means (24) for supplying light from a second end face on the side opposite to the first end face of the optical fiber probe, a reflected light amount measuring means (24) for measuring the reflected light amount obtained by the light supplied by the light supplying means being reflected by the first end face and returning to the second end face, and a moving means (18) for moving at least one of the optical fiber probe and an object (21) to be measured such that the first end face of the optical fiber probe passes through an interface (23) of the object (21) at a constant speed, and the interface property measuring device acquires the interface property of the object to be measured according to the result of measurement of the reflected light amount when the first end face of the optical fiber probe passes through the interface of the object to be measured.

摘要翻译： 低成本接口属性测量装置和方法能够实现高精度和简单的测量接口性能。 所述界面特性测量装置包括：光纤探针（1），其具有至少一部分相对于与光纤轴垂直的方向倾斜的第一端面（2），用于提供来自 在与光纤探针的第一端面相反的一侧的第二端面，反射光量测量装置，用于测量由光供给装置提供的光获得的反射光量，该反射光量由第一端 并且返回到第二端面，以及移动装置（18），用于移动光纤探针和被测量物体（21）中的至少一个，使得光纤探针的第一端面通过界面 （21）的第一端面（23），并且界面性质测量装置根据反射光量的测量结果来获取被测量物体的界面特性，当第一端面 的光纤探头穿过待测物体的界面。

公开(公告)号：US20110247661A1

公开(公告)日：2011-10-13

申请号：US13139616

申请日：2009-11-19

申请人： Atsushi Hayashida ,  Masao Watanabe ,  Toshiyuki Sanada ,  Minori Shirota

发明人： Atsushi Hayashida ,  Masao Watanabe ,  Toshiyuki Sanada ,  Minori Shirota

IPC分类号： B08B3/00

CPC分类号： H01L21/67051 ,  G03F7/42 ,  G03F7/422

摘要： A system for cleaning an object and a method for cleaning an object by irradiating a multiphase fluid containing a gas and liquid droplets, wherein a desired impact force is obtained by controlling the degree of liquid-drop-impact cavitation, which is generated when the liquid droplets in the multiphase fluid hit the object.

摘要翻译： 一种用于清洁物体的系统和用于通过照射含有气体和液滴的多相流体来清洁物体的方法，其中通过控制液滴冲击气蚀的程度获得所需的冲击力，所述冲击力是当液体 多相液体中的液滴撞击物体。