公开(公告)号：US20190057317A1

公开(公告)日：2019-02-21

申请号：US15900482

申请日：2018-02-20

Applicant: Tata Consultancy Services Limited

Inventor： Pankaj MALHOTRA ,  Vishnu T. V ,  Narendhar GUGULOTHU ,  Lovekesh VIG ,  Puneet AGARWAL ,  Gautam ShROFF

IPC: G06N7/00 ,  G01M15/14

Abstract: This disclosure relates generally to health monitoring of systems, and more particularly to monitor health of a system for fault signature identification. The system estimates Health Index (HI) of the system as time series data. By analyzing data corresponding to the estimated HI, the system identifies one or more time windows in which majority of the estimated HI values are low as a low HI window, and one or more time windows in which majority of the estimated HI values are high as a high HI window. Upon identifying a low HI window, which indicates an abnormal behavior of the system being monitored, based on a local Bayesian Network generated for the system being monitored, an Explainability Index (EI) for each sensor is generated, wherein the EI quantifies contribution of the sensor to the low HI. Further, associated component(s) is identified as contributing to abnormal/faulty behavior of the system.