公开(公告)号：US20200271692A1

公开(公告)日：2020-08-27

申请号：US16870794

申请日：2020-05-08

Applicant: Technoprobe S.p.A.

Inventor： Roberto CRIPPA ,  Flavio MAGGIONI ,  Andrea CALAON

IPC: G01R1/073

Abstract: A contact probe for a testing head of an apparatus for testing electronic devices comprises a body extending along a longitudinal axis between a first end portion and a second end portion, the second end portion being adapted to contact pads of a device under test. Suitably, the contact probe comprises a first section, which extends along the longitudinal axis from the first end portion and is made of an electrically non-conductive material, and a second section, which extends along the longitudinal axis from the second end portion up to the first section, the second section being electrically conductive and extending over a distance less than 1000 μm.