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公开(公告)号：US20210278441A1
公开(公告)日：2021-09-09
申请号：US17191059
申请日：2021-03-03
Applicant: Tektronix, Inc.
Inventor： Gary J. Waldo , Pierre Dupont
Abstract: A test and measurement instrument having an input configured to acquire waveforms from a device under test, a memory configured to store the acquired waveforms, a user input configured to receive a selection, and one or more processors. The one or more processors can render on a display the acquired waveforms, receive the selection from the user input indicating a filter criterium, such as a region of interest in the displayed acquired waveforms, determine which waveforms of the acquired waveforms are within the region of interest, and render only waveforms associated with the region of interest on the display.
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