公开(公告)号：US20230204629A1

公开(公告)日：2023-06-29

申请号：US18059297

申请日：2022-11-28

Applicant: Tektronix, Inc.

Inventor： Subhankar Ghose ,  Ankit Dash ,  David M. Bouse ,  Pradeep Joshi

IPC: G01R13/34 ,  G01R19/25

CPC classification number: G01R13/34 ,  G01R19/2509

Abstract: A method of automatically selecting a continuous time linear equalization (CTLE) filter includes capturing a response waveform for a channel of a communication link of a device under test (DUT), generating a set of candidate CTLEs, and automatically selecting the CTLE from the set of candidate CTLEs using the response waveform. A test and measurement instrument has a user interface, a port to allow the instrument to connect to a device under test (DUT), and one or more processors configured to execute code to cause the one or more processors to: generate a set of CTLE candidates; capture a response waveform for the channel; and automatically select the CTLE from the set of candidate CTLEs using the response waveform.

公开(公告)号：US20220192486A1

公开(公告)日：2022-06-23

申请号：US17549559

申请日：2021-12-13

Applicant: Tektronix, Inc.

Inventor： Subhankar Ghose ,  Ankit Dash ,  David M. Bouse

IPC: A61B3/113 ,  A61B3/00 ,  A61B3/032

Abstract: A method of generating a calibration signal includes setting a first parameter to an initial first value and a second parameter to an initial second value, generating an initial eye diagram using the initial first value and the initial second value, determining a first difference between a first dimension of the initial eye diagram and a target first dimension, and a second difference between a second dimension of the initial eye diagram and a second target dimension, estimating a next first value to cause the first difference to be zero, setting the first parameter to the next first value, generating a next eye diagram, repeating the estimating, setting, and generating until the first dimension of a most recent next eye diagram is within the first target dimension, setting a final first parameter value to a most recent next first value, setting a final second parameter value to the initial second value when the second dimension of the most recent next eye diagram is within the second target dimension, generating a calibration signal in accordance with the final first parameter value and the final second parameter value. A test and measurement device includes a user interface, at least one channel configured to connect to a device under test, a memory, and one or more processors configured to execute code to make the processors able to implement a process such as above.