公开(公告)号：US20230222382A1

公开(公告)日：2023-07-13

申请号：US18081616

申请日：2022-12-14

Applicant: Tektronix, Inc.

Inventor： Wenzheng Sun ,  Xiaolan Wang ,  Justin E. Patterson

IPC: G06N20/00

CPC classification number: G06N20/00

Abstract: A system to develop and test machine learning models has a waveform emulator machine learning system, a user interface to allow a user to input one or more design parameters for the waveform emulator machine learning system, one or more processors configured to execute code to cause the one or more processors to: send the one or more design parameters to the waveform emulator machine learning system; receive one or more data sets from the waveform emulator machine learning system, the one or more data sets based on the one or more design parameters; train a developed machine learning model using at least one of the one or more data sets, resulting in a trained machine learning model; validate the trained machine learning model using a previously unused one of the one or more data sets; adjust the trained machine learning model as needed; and repeat the training, validating, and adjusting until an optimal machine learning model is trained. A method of developing and testing machine learning models includes providing one or more design parameters to a waveform emulator machine learning system, receiving one or more data sets from the waveform emulator machine learning system, training a developed machine learning model using at least one of the one or more data sets, resulting in a trained machine learning model, validating the trained machine learning model using a previously unused one of the one or more data sets, adjusting the trained machine learning model as needed, and repeating the training, validating, and adjusting until an optimal machine learning model is trained.