公开(公告)号：US20240328781A1

公开(公告)日：2024-10-03

申请号：US18698644

申请日：2022-10-04

Applicant: TeraView Limited

Inventor： Ian Alasdair Pentland ,  Alessia Portieri ,  Philip Francis Taday ,  Bryan Edward Cole ,  Donald Dominic Arnone

IPC: G01B21/04 ,  G01B11/06 ,  G01B11/24 ,  G01N21/3581

CPC classification number: G01B21/045 ,  G01B11/0625 ,  G01B11/24 ,  G01N21/3581

Abstract: A method and apparatus is provided for determining the thickness of coating layers of a curved surface when examining the surface with terahertz radiation. The method involves measuring detected reflected radiation and applies a correction factor to obtain the thicknesses of the layers. This addresses the problem of compensating for the curvature of the surface when determining coating thickness.