公开(公告)号：US20140173548A1

公开(公告)日：2014-06-19

申请号：US14020802

申请日：2013-09-07

Applicant: Texas Instruments Incorporated

Inventor： Karl Friedrich Greb ,  Abhishek Arora ,  Riccardo Mariani Yogitech

IPC: G06F17/50

CPC classification number: G06F17/5081 ,  G06F11/008

Abstract: A tool for performing a functional safety analysis of an integrated circuit device tailored to a customer's specific application and implementation of the device. Information regarding a user's specific implementation of a given integrated circuit device is provided by the customer as input to the safety analysis tool. The tool then automatedly performs a functional safety analysis based on the information regarding the user's specific implementation of the integrated circuit device. In one embodiment, the customer specifies specific functional modules of the integrated circuit device, and the tool performs a functional safety analysis of the integrated circuit device that considers the functional modules selected by the user. In another embodiment, the customer specifies diagnostic measures that are implemented in the user's application of the integrated circuit device, and the tool automatedly performs a functional safety analysis of the integrated circuit device taking into account the diagnostic measures selected by the user.

Abstract translation: 一种用于对根据客户的特定应用和设备的实现进行定制的集成电路设备的功能安全分析的工具。 关于给定集成电路设备的用户特定实现的信息由客户提供给安全分析工具的输入。 然后，该工具基于关于集成电路设备的用户具体实现的信息自动执行功能安全性分析。 在一个实施例中，客户指定集成电路设备的特定功能模块，并且该工具执行考虑由用户选择的功能模块的集成电路设备的功能安全分析。 在另一个实施例中，客户指定在用户的集成电路设备的应用中实现的诊断措施，并且该工具考虑了用户选择的诊断措施，自动执行集成电路设备的功能安全分析。