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公开(公告)号:US11522043B2
公开(公告)日:2022-12-06
申请号:US17085116
申请日:2020-10-30
Applicant: Texas Instruments Incorporated
Inventor: Scott William Jessen , Tae Seung Kim , Steven Lee Prins , Can Duan , Abbas Ali , Erich Wesley Kinder
IPC: H01L49/02 , H01L21/8234 , H01L27/12 , H01L27/01 , H01L21/3213 , H01L21/311
Abstract: A method of fabricating an integrated circuit (IC) includes forming a dielectric layer on a substrate having a plurality of the IC. A thin-film resistor (TFR) layer is deposited on the dielectric layer, and an underlayer (UL) including carbon is formed on the TFR layer. A hard mask layer including silicon is formed on the UL. Masked etching of the hard mask layer transfers a pattern of a photoresist layer onto the hard mask layer to form a hard mask layer pattern. Masked etching of the UL transfers the hard mask layer pattern onto the UL to form a UL pattern. Masked etching of the TFR layer transfers the UL pattern onto the TFR layer to form a TFR layer pattern including a matched pair of TFRs. The matched pair of TFRs are generally included in circuitry configured together for implementing at least one function.
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公开(公告)号:US20210134939A1
公开(公告)日:2021-05-06
申请号:US17085116
申请日:2020-10-30
Applicant: Texas Instruments Incorporated
Inventor: Scott William Jessen , Tae Seung Kim , Steven Lee Prins , Can Duan , Abbas Ali , Erich Wesley Kinder
IPC: H01L49/02 , H01L21/8234 , H01L27/01 , H01L27/12
Abstract: A method of fabricating an integrated circuit (IC) includes forming a dielectric layer on a substrate having a plurality of the IC. A thin-film resistor (TFR) layer is deposited on the dielectric layer, and an underlayer (UL) including carbon is formed on the TFR layer. A hard mask layer including silicon is formed on the UL. Masked etching of the hard mask layer transfers a pattern of a photoresist layer onto the hard mask layer to form a hard mask layer pattern. Masked etching of the UL transfers the hard mask layer pattern onto the UL to form a UL pattern. Masked etching of the TFR layer transfers the UL pattern onto the TFR layer to form a TFR layer pattern including a matched pair of TFRs. The matched pair of TFRs are generally included in circuitry configured together for implementing at least one function.
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