公开(公告)号：US10560112B2

公开(公告)日：2020-02-11

申请号：US16374145

申请日：2019-04-03

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Thomas Fuchs ,  Rudiger Kuhn ,  Bernhard Wolfgang Ruck

IPC: H03M1/10 ,  H03M7/16 ,  H03M1/46 ,  H03M5/00

Abstract: An analog-to-digital converter (ADC) includes a digital-to-analog converter (DAC) that has a configurable capacitor array. Based on measurements of differential nonlinearity (DNL) and/or integral nonlinearity (INL) error by an external test computer system, an order for use of the DAC's capacitors can be determined so as to reduce DNL error aggregation, also called INL. The DAC includes a switch matrix that can be programmed by programming data supplied by the test computer system.

公开(公告)号：US20190229743A1

公开(公告)日：2019-07-25

申请号：US16374145

申请日：2019-04-03

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Thomas Fuchs ,  Rudiger Kuhn ,  Bernhard Wolfgang Ruck

IPC: H03M1/10 ,  H03M1/46 ,  H03M5/00 ,  H03M7/16

CPC classification number: H03M1/1071 ,  H03M1/1038 ,  H03M1/466 ,  H03M1/468 ,  H03M5/00 ,  H03M7/165

Abstract: An analog-to-digital converter (ADC) includes a digital-to-analog converter (DAC) that has a configurable capacitor array. Based on measurements of differential nonlinearity (DNL) and/or integral nonlinearity (INL) error by an external test computer system, an order for use of the DAC's capacitors can be determined so as to reduce DNL error aggregation, also called INL. The DAC includes a switch matrix that can be programmed by programming data supplied by the test computer system.

公开(公告)号：US10298250B2

公开(公告)日：2019-05-21

申请号：US15483046

申请日：2017-04-10

Applicant: Texas Instruments Incorporated

Inventor： Thomas Fuchs ,  Rudiger Kuhn ,  Bernhard Wolfgang Ruck

IPC: H03M1/10 ,  H03M1/46 ,  H03M5/00 ,  H03M7/16

Abstract: An analog-to-digital converter (ADC) includes a digital-to-analog converter (DAC) that has a configurable capacitor array. Based on measurements of differential nonlinearity (DNL) and/or integral nonlinearity (INL) error by an external test computer system, an order for use of the DAC's capacitors can be determined so as to reduce DNL error aggregation, also called INL. The DAC includes a switch matrix that can be programmed by programming data supplied by the test computer system.