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1.
公开(公告)号:US12107597B2
公开(公告)日:2024-10-01
申请号:US17857621
申请日:2022-07-05
Applicant: REALTEK SEMICONDUCTOR CORPORATION
Inventor: Shih-Hsiung Huang , Wei-Cian Hong , Sheng-Yen Shih
CPC classification number: H03M1/468 , H03M1/1245
Abstract: A successive approximation register analog to digital converter includes a charge injection digital to analog converter (DAC) circuit, a comparator circuit, and a control logic circuitry. The charge injection DAC circuit includes capacitors that sample input signals to generate first and second signals and charge injection circuits that selectively adjust the first or the second signals according to enable signals and decision signals. The comparator circuit compares the first and second signals to generate the decision signals. The control logic circuitry controls a circuit of the charge injection circuits to adjust the first and the second signals during an initial phase, in order to adjust a switching sequence of the circuit according to the decision signals corresponding to the initial phase, and generates the enable signals according to the decision signals and the adjusted switching sequence during a conversion phase to generate a digital output.
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公开(公告)号:US11888497B2
公开(公告)日:2024-01-30
申请号:US17893076
申请日:2022-08-22
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Debapriya Sahu , Pranav Sinha , Meghna Agrawal
CPC classification number: H03M1/462 , H03M1/0626 , H03M1/182 , H03M1/468
Abstract: An analog-to-digital converter (ADC) includes a switched capacitor circuit, a comparator, and a control circuit. The switched capacitor circuit has a switch control input and an output, and includes switches coupled to the switch control input and coupled to capacitors. The comparator has an input coupled to the output of the switched capacitor circuit and has an output. The control circuit has a switch control output coupled to the switch control input, has an input coupled to the output of the comparator, and provides switch control signals at the switch control output. Responsive to the switch control signals, the switched capacitor circuit provides an output signal to the comparator that is based on a sample of an analog input signal acquired in a sample acquisition cycle and based on a digital sample value output by the ADC prior to the sample acquisition cycle.
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3.
公开(公告)号:US20230299785A1
公开(公告)日:2023-09-21
申请号:US17700166
申请日:2022-03-21
Inventor: Ullas Singh , Namik Kocaman , Mohammadamin Torabi , Meisam Honarvar Nazari , Mehmet Batuhan Dayanik , Delong Cui , Jun Cao
CPC classification number: H03M1/462 , H03M1/0697 , H03M1/468
Abstract: Systems and methods are related to a successive approximation analog to digital converter (SAR ADC). In one aspect, a method includes sampling, by a sample and digital to analog conversion (DAC) circuit, an input voltage to obtain a sampled voltage. The method also includes determining, by a comparator coupled to a set of storage circuits, a state of a plurality of bits corresponding to the sampled voltage. The comparator has a current parameter or voltage parameter adjusted based upon a conversion margin. Adjustment of the current parameter or the voltage parameter affects speed of determining the state of the bits. The method also includes storing the bits in the set of storage circuits. In some aspects, an SAR ADC is configured to perform the method.
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公开(公告)号:US20230179889A1
公开(公告)日:2023-06-08
申请号:US17540434
申请日:2021-12-02
Applicant: OmniVision Technologies,Inc.
Inventor: Chao-Fang Tsai , Zheng Yang , Chun-Hsiang Chang
IPC: H04N5/3745 , H03M1/46 , H03M1/56 , H04N5/378
CPC classification number: H04N5/37455 , H03M1/468 , H03M1/462 , H03M1/56 , H04N5/378
Abstract: A differential subrange analog-to-digital converter (ADC) converts differential analog image signals received from sample and hold circuits to a digital signal through an ADC comparator. The comparator of the differential subrange ADC is shared by a successive approximation register (SAR) ADC coupled to provide both M upper output bits (UOB) and a ramp ADC coupled to provide N lower output bits (LOB). Digital-to-analog converters (DACs) of the differential subrange SAR ADC comprises 2M buffered bit capacitor fingers connected to the comparator. Each buffered bit capacitor finger comprises a bit capacitor, a bit buffer, and a bit switch controlled by the UOB. Both DACs are initialized to preset values and finalized based on the values of the least significant bit of the UOB. The subsequent ramp ADC operation will be ensured to have its first ramp signal ramps in a monotonic direction and its second ramp signal ramp in an opposite direction.
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公开(公告)号:US20190238148A1
公开(公告)日:2019-08-01
申请号:US16378532
申请日:2019-04-08
Applicant: Forza Silicon Corporation
Inventor: Daniel Van Blerkom
CPC classification number: H03M1/1215 , H03M1/1205 , H03M1/122 , H03M1/123 , H03M1/38 , H03M1/40 , H03M1/403 , H03M1/46 , H03M1/462 , H03M1/464 , H03M1/466 , H03M1/468
Abstract: Methods and systems for analog-to-digital conversion using two side branches that may be operated with overlapped timing such that a sampling phase may be overlapped with a previous conversion phase. Some embodiments provide a method of successive approximation A/D converting, comprising sampling a first signal onto a first capacitor that is configured to selectively couple to an analog input of a comparator, sampling a second signal onto capacitors that are coupled to a second analog input of the comparator and configured for charge redistribution successive approximation A/D conversion; carrying out, based on the first signal and the second signal, a charge redistribution successive approximation A/D conversion using the capacitors; and while carrying out the charge redistribution successive approximation A/D conversion based on the first and second signals, sampling a third signal onto a third capacitor that is configured to selectively couple to the analog input of a comparator.
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公开(公告)号:US20190222222A1
公开(公告)日:2019-07-18
申请号:US16261945
申请日:2019-01-30
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Shridhar MORE , Rahul Vijay KULKARNI
IPC: H03M1/46
Abstract: An analog-to-digital converter includes an input terminal, a digital-to-analog converter, a comparator, and successive approximation circuitry. The input terminal is configured to receive a multi-bit digital threshold value from circuitry external to the analog-to-digital converter. The successive approximation circuitry is coupled to the comparator and the digital-to-analog converter. The successive approximation circuitry is configured to operate in a comparison mode and a conversion mode, and to provide the multi-bit digital threshold value to the digital-to-analog converter while operating in the comparison mode. The comparator is coupled to the digital-to-analog converter and the successive approximation circuity. The comparator is configured to output a signal that indicates whether an analog input signal exceeds an analog threshold signal corresponding to the multi-bit digital threshold value.
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7.
公开(公告)号:US20190173482A1
公开(公告)日:2019-06-06
申请号:US16173398
申请日:2018-10-29
Applicant: Avnera Corporation
Inventor: Wai Lee , Jianping Wen , Garry N. Link
CPC classification number: H03M1/462 , H03M1/1033 , H03M1/188 , H03M1/447 , H03M1/468
Abstract: The disclosure includes a mechanism for mitigating electrical current leakage in a Successive Approximation Register (SAR) Analog to Digital Converter (ADC) by using a Flash ADC in conjunction with the SAR ADC. A sequence controller in the SAR ADC uses the output of the Flash ADC to control a switch array. Depending on the output of the Flash ADC, the sequence controller can control the switch array to couple at least one capacitor in the capacitor network of the SAR ADC to a voltage that reduces charge leakage in the SAR ADC. The voltage may be a pre-defined positive or negative reference voltage.
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公开(公告)号:US20190058486A1
公开(公告)日:2019-02-21
申请号:US16168774
申请日:2018-10-23
Applicant: SHENZHEN GOODIX TECHNOLOGY CO., LTD.
Inventor: Shuo FAN
CPC classification number: H03M1/466 , H03M1/002 , H03M1/1245 , H03M1/129 , H03M1/468
Abstract: An analog-to-digital conversion circuit and method are provided. At a sampling stage, the first capacitor array connects lower electrode plates of N capacitors to a first input voltage, connect lower electrode plates of the other capacitors to a common-mode voltage, and connect upper electrode plates of all the capacitors to the common-mode voltage to sample the first input voltage; in an ith conversion at a conversion stage, the logic circuit controls, the lower electrode plate of an ith capacitor to connect to a reference voltage or a ground voltage, a first comparison voltage output by the first capacitor array approximates a second comparison voltage; and the comparator stores a comparison result between the first and the second comparison voltage to an i+1th flag bit in the logic circuit, and analog-to-digital conversion is completed when i+1 is equal to the total number of capacitors in the first capacitor array.
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公开(公告)号:US20190020351A1
公开(公告)日:2019-01-17
申请号:US16119739
申请日:2018-08-31
Applicant: SHENZHEN GOODIX TECHNOLOGY CO., LTD.
Inventor: Shuo FAN
Abstract: A capacitive successive approximation analog-to-digital converter is provided, where the capacitive successive approximation analog-to-digital converter includes a first capacitor array including N first capacitors; a second capacitor array including N second capacitors; a voltage generation circuit configured to generate a common mode voltage, a reference voltage, a first voltage and a second voltage; a first switch, a second switch, N third switches and N fourth switches; a comparator including a first input end, a second input end and an output end, where upper plates of the N first capacitors are connected to the first input end and upper plates of the N second capacitors are connected to the second input end; and a successive approximation logic controller connected to the output end of the comparator. The capacitive successive approximation analog-to-digital converter in the above technical solution can use 2N capacitors to implement outputting an N-bit binary code.
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10.
公开(公告)号:US20180331689A1
公开(公告)日:2018-11-15
申请号:US15653156
申请日:2017-07-18
Applicant: YUAN-JU CHAO , TA-SHUN CHU
Inventor: YUAN-JU CHAO , TA-SHUN CHU
CPC classification number: H03K5/24 , H03K2005/00058 , H03M1/00 , H03M1/06 , H03M1/1071 , H03M1/12 , H03M1/125 , H03M1/468
Abstract: A method of increasing SAR ADC conversion rate and reducing power consumption by employing a new timing scheme and minimizing timing delay for each bit-test during binary-search process. The high frequency clock input requirement is eliminated and higher speed rate can be achieved in SAR ADC.
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