公开(公告)号：US11675002B2

公开(公告)日：2023-06-13

申请号：US17121851

申请日：2020-12-15

申请人： The Government of the United States, as represented by the Secretary of the Army

发明人： Greg Rupper ,  John Suarez ,  Sergey Rudin ,  Meredith Reed ,  Michael Shur

IPC分类号： G01R31/311 ,  G01R31/265 ,  G01R31/3185 ,  G01R31/28

CPC分类号： G01R31/311 ,  G01R31/2656 ,  G01R31/2815 ,  G01R31/318533

摘要： Various embodiments are described that relate to failure determination for an integrated circuit. An integrated circuit can be tested to determine if the integrated circuit is functioning properly. The integrated circuit can be subjected to a specific radiation such that the integrated circuit produces a response. This response can be compared against an expected response to determine if the response matches the expected response. If the response does not match the expected response, then the integrated circuit fails the test. If the response matches the expected response, then the integrated circuit passes the test.

公开(公告)号：US10890618B2

公开(公告)日：2021-01-12

申请号：US15437713

申请日：2017-02-21

申请人： The Government of the United States, as represented by the Secretary of the Army

发明人： Greg Rupper ,  John Suarez ,  Sergey Rudin ,  Meredith Reed ,  Michael Shur

IPC分类号： G01R31/311 ,  G01R31/265 ,  G01R31/3185 ,  G01R31/28

摘要： Various embodiments are described that relate to failure determination for an integrated circuit. An integrated circuit can be tested to determine if the integrated circuit is functioning properly. The integrated circuit can be subjected to a specific radiation such that the integrated circuit produces a response. This response can be compared against an expected response to determine if the response matches the expected response. If the response does not match the expected response, then the integrated circuit fails the test. If the response matches the expected response, then the integrated circuit passes the test.

公开(公告)号：US20180238961A1

公开(公告)日：2018-08-23

申请号：US15437713

申请日：2017-02-21

申请人： The Government of the United States, as represented by the Secretary of the Army

发明人： Greg Rupper ,  John Suarez ,  Sergey Rudin ,  Meredith Reed ,  Michael Shur

IPC分类号： G01R31/311 ,  G01R31/28 ,  G01R31/3185 ,  G01R31/265

CPC分类号： G01R31/311 ,  G01R31/2656 ,  G01R31/2815 ,  G01R31/318533

摘要： Various embodiments are described that relate to failure determination for an integrated circuit. An integrated circuit can be tested to determine if the integrated circuit is functioning properly. The integrated circuit can be subjected to a specific radiation such that the integrated circuit produces a response. This response can be compared against an expected response to determine if the response matches the expected response. If the response does not match the expected response, then the integrated circuit fails the test. If the response matches the expected response, then the integrated circuit passes the test.

公开(公告)号：US20230393195A1

公开(公告)日：2023-12-07

申请号：US18207701

申请日：2023-06-09

申请人： The Government of the United States, as represented by the Secretary of the Army

发明人： Greg Rupper ,  John Suarez ,  Sergey Rudin ,  Meredith Reed ,  Michael Shur

IPC分类号： G01R31/311 ,  G01R31/265 ,  G01R31/3185 ,  G01R31/28

CPC分类号： G01R31/311 ,  G01R31/2656 ,  G01R31/318533 ,  G01R31/2815

摘要： Various embodiments are described that relate to failure determination for an integrated circuit. An integrated circuit can be tested to determine if the integrated circuit is functioning properly. The integrated circuit can be subjected to a specific radiation such that the integrated circuit produces a response. This response can be compared against an expected response to determine if the response matches the expected response. If the response does not match the expected response, then the integrated circuit fails the test. If the response matches the expected response, then the integrated circuit passes the test.

公开(公告)号：US20220011363A1

公开(公告)日：2022-01-13

申请号：US17121851

申请日：2020-12-15

申请人： The Government of the United States, as represented by the Secretary of the Army

发明人： Greg Rupper ,  John Suarez ,  Sergey Rudin ,  Meredith Reed ,  Michael Shur

IPC分类号： G01R31/311 ,  G01R31/265 ,  G01R31/3185 ,  G01R31/28

摘要： Various embodiments are described that relate to failure determination for an integrated circuit. An integrated circuit can be tested to determine if the integrated circuit is functioning properly. The integrated circuit can be subjected to a specific radiation such that the integrated circuit produces a response. This response can be compared against an expected response to determine if the response matches the expected response. If the response does not match the expected response, then the integrated circuit fails the test. If the response matches the expected response, then the integrated circuit passes the test.