公开(公告)号：US20240241049A1

公开(公告)日：2024-07-18

申请号：US18233242

申请日：2023-08-11

Applicant: The Texas A&M University System

Inventor： Junhwi Bak ,  Yue Wu ,  Richard Bryant Miles ,  Christopher M. Limbach

IPC: G01N21/49

CPC classification number: G01N21/49 ,  G01N2201/068

Abstract: A system for measurement of light scattering from a test article includes a light emitting device, configured to emit a light beam onto the test article along light axis, a collection assembly configured to collect scattered light from the test article along a measurement axis that is oriented at a non-zero angle from the light axis, wherein the collection assembly includes a first angular spectral filter, and a second angular spectral filter spaced from the first angular spectral filter along the measurement axis, wherein a position or orientation of at least one of the first angular spectral filter and the second angular spectral is adjustable relative to the measurement axis.