Rapid line scan NMR imaging
    2.
    发明授权
    Rapid line scan NMR imaging 失效
    快速线扫描NMR成像

    公开(公告)号:US4818937A

    公开(公告)日:1989-04-04

    申请号:US162750

    申请日:1988-03-01

    CPC分类号: G01R33/561 G01R33/54

    摘要: NMR imaging is effected by application of two normal diagonal planes to develop line volumes at major intersections which are converted into a slice image. Rapid line scan imaging is achieved by successive diagonal excitation of previously unexcited regions. Spoiler magnetic gradient fields and applied periodically to dephase and in turn eliminate minor or spurious echoes from other intersections of the two normal diagonal planes.

    摘要翻译: NMR成像通过应用两个正常的对角线平面来实现,以在主要交点处形成转换成切片图像的线体积。 快速线扫描成像是通过先前无区域的连续对角线激发实现的。 扰流器磁梯度场并周期性地应用于去相位,从而消除来自两个正常对角线平面的其他交点的微小或杂散回波。

    Process for examining mineral samples with X-ray microscope and projection systems
    3.
    发明授权
    Process for examining mineral samples with X-ray microscope and projection systems 有权
    用X射线显微镜和投影系统检查矿物样品的方法

    公开(公告)号:US08068579B1

    公开(公告)日:2011-11-29

    申请号:US12421380

    申请日:2009-04-09

    IPC分类号: G01N23/00

    CPC分类号: G01N23/046 G01N2223/419

    摘要: A process to determine the porosity and/or mineral content of mineral samples with an x-ray CT system is described. Based on the direct-projection techniques that use a spatially-resolved x-ray detector to record the x-ray radiation passing through the sample, 1 micrometer or better resolution is achievable. Furthermore, by using an x-ray objective lens to magnify the x-ray image in a microscope configuration, a higher resolution of up to 50 nanometers or more is achieved with state-of-the-art technology. These x-ray CT techniques directly obtain the 3D structure of the sample with no modifications to the sample being necessary. Furthermore, fluid or gas flow experiments can often be conducted during data acquisition so that one may perform live monitoring of the physical process in 3D.

    摘要翻译: 描述了使用X射线CT系统确定矿物样品的孔隙率和/或矿物质含量的方法。 基于使用空间分辨的X射线检测器记录通过样品的x射线辐射的直接投影技术,可以实现1微米或更好的分辨率。 此外,通过使用x射线物镜以显微镜配置放大X射线图像,通过最先进的技术实现高达50纳米或更高的分辨率。 这些X射线CT技术直接获得样品的3D结构,而不需要对样品进行修改。 此外,流体或气体流动实验通常可以在数据采集期间进行,以便可以对3D中的物理过程进行实时监测。

    Metrology and registration system and method for laminography and tomography
    4.
    发明授权
    Metrology and registration system and method for laminography and tomography 有权
    计量和注册系统和方法进行层析和层析成像

    公开(公告)号:US07974379B1

    公开(公告)日:2011-07-05

    申请号:US12556341

    申请日:2009-09-09

    IPC分类号: G01N23/04

    CPC分类号: G01N23/044 G01N2223/419

    摘要: A metrology system that uses an imaging system to monitor alignment features on the sample or sample holder of an X-ray laminography or tomography system. the metrology system has the capability to provide both sample shift and sample rotation movement data to a data acquisition system. These shift and rotation data can be used in alignment routines to produce 3D reconstructions from the X-ray images/projections. The metrology system is based on an imaging and focusing measurement of intrinsic feature of the sample or artificial features fabricated on the sample or sample holder.

    摘要翻译: 一种使用成像系统来监测X射线层析成像系统的样品或样品架上的对准特征的计量系统。 测量系统具有将采样位移和采样旋转运动数据提供给数据采集系统的能力。 这些移位和旋转数据可用于对准程序,以从X射线图像/投影产生3D重建。 测量系统基于对样品或样品架上制作的样品或人造特征的固有特征的成像和聚焦测量。