公开(公告)号：US11567855B1

公开(公告)日：2023-01-31

申请号：US17015778

申请日：2020-09-09

申请人： Two Six Labs, LLC

发明人： Austin Fletcher ,  Daniel Su ,  Bradley Boccuzzi

IPC分类号： G06F11/36 ,  G06F11/263 ,  G06F11/277

摘要： An automated fault injection testing and analysis approach drives fault injection into a processor driven instruction sequence to quantify and define susceptibility to external fault injections for manipulating instruction execution and control flow of a set of computer instructions. A fault injection such as a voltage or electromagnetic pulse directed at predetermined locations on a processor (Central Processing Unit, or CPU) alters a result of a processor instruction to change values or execution paths. One or more quantified injections define an injection chain that causes a predictable or repeatable deviant result from an expected execution path through the code executed by the processor. Based on accumulation of fault injections and results, a repeatable injection chain and probability identifies an external action taken on a processing device to cause unexpected results that differ from an expected execution of a program or set of computer instructions.