公开(公告)号：US20240176335A1

公开(公告)日：2024-05-30

申请号：US18433511

申请日：2024-02-06

Applicant: UNITED MICROELECTRONICS CORP.

Inventor： Yung-Yu Yang ,  Kang-Ping Li ,  Chih-Kuan Chang ,  Chung-Chih Hung ,  Chen-Hui Huang ,  Nai-Ying Lo ,  Shih-Wei Huang

IPC: G05B19/418 ,  G05B23/02

CPC classification number: G05B19/41865 ,  G05B23/0281 ,  G05B2219/45031

Abstract: A fault detection method, includes the following steps. A target sequence is received, the target sequence includes several data. A first moving average operation is performed on the target sequence to establish a first moving average sequence. A second moving average operation is performed on the target sequence to establish a second moving average sequence. A difference operation between the first moving average sequence and the second moving average sequence is performed to obtain a difference sequence, the difference sequence includes several difference values. An upper limit value is set. When one of the difference values is greater than the upper limit value, the target sequence is determines as abnormal.