公开(公告)号：US10794795B2

公开(公告)日：2020-10-06

申请号：US16132128

申请日：2018-09-14

Applicant: UNITED TECHNOLOGIES CORPORATION

Inventor： Eli Cole Warren ,  Michael F. Sabol ,  Alan E. Ingram ,  Michael J. Saitta ,  Darren M. Wind ,  Steven D Mitchell ,  Sebastian Martinez ,  Kevin Andrew Ford ,  Patrick M. Harrington

IPC: G01M15/14 ,  F01D25/24 ,  F02C3/04 ,  F02C7/00 ,  F02K3/06

Abstract: A low profile un-lensed non-intrusive stress measurement system probe may comprise a housing comprising a first channel and an optical face, a first hypotube disposed within the first channel and coupled at a sensing aperture in the optical face, and a plurality of optical fibers disposed within the first hypotube, wherein the first hypotube executes a bend between 45° and 90° within the housing.