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公开(公告)号:US11270002B2
公开(公告)日:2022-03-08
申请号:US15978734
申请日:2018-05-14
Inventor: Mark M. Tehranipoor , Adib Nahiyan , Domenic J. Forte
Abstract: Disclosed are various embodiments for detecting hardware Trojans through information flow security verification. A file comprising register transfer level (HDL) code for an intellectual property core is loaded from memory. An asset within the intellectual property core is identified. An integrity verification or confidentiality verification of the HDL code that represents the asset is performed. An integrity violation or confidentiality violation within the HDL code as a result of performance of the integrity verification or confidentiality violation on the HDL code that represents the asset is detected. A malicious control point or a malicious observation point linked to the asset is identified. Finally, a trigger circuit for a hardware Trojan is identified in response to identification of the malicious control point or malicious observation point.
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公开(公告)号:US11475168B2
公开(公告)日:2022-10-18
申请号:US16520002
申请日:2019-07-23
Inventor: Mark M. Tehranipoor , Adib Nahiyan , Domenic J. Forte , Jungmin Park
IPC: G06F21/75 , G06F30/30 , G06F30/34 , G06F119/06
Abstract: Various examples are provided related to power side-channel vulnerability assessment. In one example, a method includes identifying target registers in an IC design; generating input patterns associated with a target function that can generate a power difference in the target registers when processing the target function; determining a side-channel vulnerability (SCV) metric using the power difference produced by the input patterns; and identifying a vulnerability in the IC design using the SCV metric. Identification of the vulnerability allows for modification of the IC design at an early stage, which can avoid power side-channel attacks (e.g., DPA and CPA) in the fabricated IC design. The method can be used for pre-silicon power side-channel leakage assessment of IC designs such as, e.g., cryptographic and non-cryptographic circuits.
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公开(公告)号:US20200065456A1
公开(公告)日:2020-02-27
申请号:US16535795
申请日:2019-08-08
Inventor: Mark M. Tehranipoor , Domenic J. Forte , Farimah Farahmandi , Adib Nahiyan , Fahim Rahman , Mohammad Sazadur Rahman
IPC: G06F21/14 , H03K19/177 , G06F21/72 , G06F12/14
Abstract: A dynamically obfuscated scan chain (DOSC) includes a control module designed to control memory loading, a linear feedback shift register (LFSR), a dynamic Obfuscation Key generator configured to use LFSR to generate a φ-bit protected Obfuscation Key, in order to confuse and change the test data into an output scan vectors when the Obfuscation Key update is triggered. The DOSC also includes a shadow chain, configured to input the φ-bit protected Obfuscation Key generated by the LFSR, and output k └φ×α┘-bit protected Obfuscation Keys, and obfuscated scan chains. The DOSC operating method includes: loading control vectors to LFSR from control module during initialization; generating the Obfuscation Key at an output of the LFSR; generating the Obfuscation Key bit by bit based at least in part on the shadow chain and the Obfuscation Key during a first scan clock after reset in order to confuse test patterns.
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公开(公告)号:US20210026994A1
公开(公告)日:2021-01-28
申请号:US16520002
申请日:2019-07-23
Inventor: Mark M. Tehranipoor , Adib Nahiyan , Domenic J. Forte , Jungmin Park
Abstract: Various examples are provided related to power side-channel vulnerability assessment. In one example, a method includes identifying target registers in an IC design; generating input patterns associated with a target function that can generate a power difference in the target registers when processing the target function; determining a side-channel vulnerability (SCV) metric using the power difference produced by the input patterns; and identifying a vulnerability in the IC design using the SCV metric. Identification of the vulnerability allows for modification of the IC design at an early stage, which can avoid power side-channel attacks (e.g., DPA and CPA) in the fabricated IC design. The method can be used for pre-silicon power side-channel leakage assessment of IC designs such as, e.g., cryptographic and non-cryptographic circuits.
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