公开(公告)号：US20200003639A1

公开(公告)日：2020-01-02

申请号：US16534703

申请日：2019-08-07

Applicant: United Technologies Corporation

Inventor： Lyutsia Dautova ,  Wendell V. Twelves, JR. ,  Joe Ott ,  Evan J. Butcher ,  Gary A. Schirtzinger ,  Rainer J. Hebert

IPC: G01L1/25 ,  G01N23/20 ,  B22F3/105 ,  B33Y10/00 ,  B33Y40/00 ,  B23K26/342 ,  B23K26/70

Abstract: A method of monitoring the residual stress in surface and near surface regions of a component includes identifying predetermined locations on the surface of a component that are expected to experience high stress during normal operating conditions of the component. Marker particles are introduced into the component during additive manufacture of the component at the predetermined locations. Then, the residual stress of the component is measured at a location corresponding with the marker material using x-ray techniques.