公开(公告)号：US12216085B2

公开(公告)日：2025-02-04

申请号：US17897248

申请日：2022-08-29

Applicant: University of Electronic Science and Technology of China

Inventor： Libing Bai ,  Xu Zhang ,  Chao Ren ,  Yiping Liang ,  Ruiheng Zhang ,  Yong Duan ,  Jinliang Shao ,  Yali Zheng ,  Yuhua Cheng

IPC: G01N27/90 ,  G01N1/44 ,  G01N25/72

Abstract: The present invention provides a method for eddy current thermography defect reconstruction based on electrical impedance tomography, first, obtaining a thermal reference image of temperature change with time by acquiring a thermogram sequence S of the specimen in the process of heating and fitting a curve for pixels of each location of the thermogram sequence S, then, creating a current matrix and a magnetic potential matrix, and calculating the satisfied conductivity distribution through iterations, so as a reconstructed image is obtained, then taking the low conductivity area of the reconstructed image as the defect profile, thus the defect profile is identified and quantified.