公开(公告)号：US20180252590A1

公开(公告)日：2018-09-06

申请号：US15968758

申请日：2018-05-02

Applicant: University of Electronic Science and Technology of China

Inventor： Ziji Liu ,  Shengchen Zhao ,  Zhiqing Liang ,  Hongbo Zhang ,  Tao Wang ,  Yadong Jiang

IPC: G01J5/52 ,  G01J5/10

CPC classification number: G01J5/522 ,  G01J5/10 ,  G01J2005/0048 ,  G01R31/2656

Abstract: A system for testing thermal response time of an uncooled infrared focal plane detector array and a method therefor is provided. The system comprises: a blackbody, a chopper, a detector unit under test and a testing system. The method comprises: emitting radiation by the blackbody, chopping by the chopper, then radiating the radiation to the uncooled infrared focal plane detector array under test; generating different responses on the radiation at different chopping frequencies by the uncooled infrared focal plane detector array under test; collecting different response values of the uncooled infrared focal plane detector array under test at different chopping frequencies; obtaining response amplitude at a corresponding frequency in a frequency domain by FFT; fitting according to a formula Rv  ( f ) = Rv  ( 0 ) 1 + ( 2  π   f   τ ) 2 to obtain the thermal response time.

公开(公告)号：US10274376B2

公开(公告)日：2019-04-30

申请号：US15968758

申请日：2018-05-02

Applicant: University of Electronic Science and Technology of China

Inventor： Ziji Liu ,  Shengchen Zhao ,  Zhiqing Liang ,  Hongbo Zhang ,  Tao Wang ,  Yadong Jiang

IPC: G01J5/52 ,  G01J5/10 ,  G01R31/265 ,  G01J5/00

Abstract: A system for testing thermal response time of an uncooled infrared focal plane detector array and a method therefor is provided. The system comprises: a blackbody, a chopper, a detector unit under test and a testing system. The method comprises: emitting radiation by the blackbody, chopping by the chopper, then radiating the radiation to the uncooled infrared focal plane detector array under test; generating different responses on the radiation at different chopping frequencies by the uncooled infrared focal plane detector array under test; collecting different response values of the uncooled infrared focal plane detector array under test at different chopping frequencies; obtaining response amplitude at a corresponding frequency in a frequency domain by FFT; fitting according to a formula Rv ⁡ ( f ) = Rv ⁡ ( 0 ) 1 + ( 2 ⁢ π ⁢ ⁢ f ⁢ ⁢ τ ) 2 to obtain the thermal response time.