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1.发明申请公开(公告)号：US20180137014A1
公开(公告)日：2018-05-17
申请号：US15354984
申请日：2016-11-17
Applicant: VMware, Inc.
Inventor： Cheng Li , Li Ding , Bret Needle , Mayank Rawat
CPC classification number: G06F11/1458 , G06F16/128 , G06F2201/815
Abstract: System and method for checking and characterizing metadata of snapshots utilize a snapshot metadata database to execute at least one of checking and characterizing operations on the metadata of snapshots. The snapshot metadata database includes information extracted from backing storage elements containing the metadata of snapshots.
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2.发明授权公开(公告)号：US10802927B2
公开(公告)日：2020-10-13
申请号：US15354984
申请日：2016-11-17
Applicant: VMware, Inc.
Inventor： Cheng Li , Li Ding , Bret Needle , Mayank Rawat
Abstract: System and method for checking and characterizing metadata of snapshots utilize a snapshot metadata database to execute at least one of checking and characterizing operations on the metadata of snapshots. The snapshot metadata database includes information extracted from backing storage elements containing the metadata of snapshots.
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