Control apparatus for testing a random access memory
    2.
    发明授权
    Control apparatus for testing a random access memory 有权
    用于测试随机存取存储器的控制装置

    公开(公告)号:US06295239B1

    公开(公告)日:2001-09-25

    申请号:US09649125

    申请日:2000-08-28

    IPC分类号: G11C700

    CPC分类号: G11C29/08 G11C29/16

    摘要: A logic device includes a RAM and control apparatus (10). The control apparatus (10) is adapted to receive input signals (6) from a processor and the control apparatus (10) is also adapted to be coupled to the RAM to send signals to the RAM in response to the input signals (6). The control apparatus (10) includes a data generator (3) and the data generator generates a test bit pattern which is dependent on the received input signals (6).

    摘要翻译: 逻辑装置包括RAM和控制装置(10)。 控制装置(10)适于从处理器接收输入信号(6),并且控制装置(10)还适于耦合到RAM以响应于输入信号(6)向RAM发送信号。 控制装置(10)包括数据发生器(3),数据发生器产生取决于所接收的输入信号(6)的测试位模式。