专利检索 ap:("WINBOND ELECTRONICS CORPORATION") AND inv:"Erez Glasberg" 第 1 页

1.

发明公开
Automatic Functional Test Pattern Generation based on DUT Reference Model and Unique Scripts 审中-公开

公开(公告)号：US20230315598A1

公开(公告)日：2023-10-05

申请号：US17713260

申请日：2022-04-05

申请人： WINBOND ELECTRONICS CORPORATION

发明人： Tal Klein , Ronny Aboutboul , Yoram Avigdor , Erez Glasberg

IPC分类号： G06F11/27 , G06F30/20

CPC分类号： G06F11/27 , G06F30/20

摘要： An apparatus for generating Automatic Test Equipment (ATE) testing patterns to test an electronic device-under-test (DUT) that includes electrical circuitry, at least one input port and at least one output port. The apparatus includes a memory and a processor. The memory is configured to store (i) a high-level verification language (HVL) model of the IC, including a model input that models the at least one DUT input port and a model output that models the at least one DUT output port, the HVL model configured to determine, obliviously to the electrical circuitry, a logic state of the model output responsively to a logic state of the model input, and (ii) a simulation program, configured to simulate the HVL model of the DUT. The processor is configured to generate an ATE testing pattern for the DUT by running the simulation program.