摘要:
Wireless test equipment may be used to perform over-the-air testing of user equipment. The user equipment may contain an antenna and a receiver. The wireless test equipment may contain a call box that performs network-level testing by sending and receiving protocol-compliant network messages. The call box may transmit a radio-frequency test signal at a predetermined power. The antenna in the user equipment may receive the radio-frequency test signal and may provide the received radio-frequency test signal to the input of the receiver. The call box may send a network message such as a code-division-multiple-access intercode handover command to the user equipment to direct the user equipment to measure the received radio-frequency test signal power at the input of the receiver. The measured power may be transmitted to the call box as part of a pilot measurement message indicator, using an intercode handover command, or using other network messages.
摘要:
Wireless test equipment may be used to perform over-the-air testing of user equipment. The user equipment may contain an antenna and a receiver. The wireless test equipment may contain a call box that performs network-level testing by sending and receiving protocol-compliant network messages. The call box may transmit a radio-frequency test signal at a predetermined power. The antenna in the user equipment may receive the radio-frequency test signal and may provide the received radio-frequency test signal to the input of the receiver. The call box may send a network message such as a code-division-multiple-access intercode handover command to the user equipment to direct the user equipment to measure the received radio-frequency test signal power at the input of the receiver. The measured power may be transmitted to the call box as part of a pilot measurement message indicator, using an intercode handover command, or using other network messages.
摘要:
A test station may include a test host, a test unit, and a test chamber. Multiple devices under test (DUTs) may be placed in the test chamber during wireless testing. Radio-frequency signals may be conveyed between the test unit and the multiple DUTs using a conducted arrangement through a splitter-combiner circuit or using a radiated arrangement through a test antenna in the test chamber. The multiple DUTs may be synced to the test unit one DUT at a time (in series) or in parallel. The test host may direct the test unit to broadcast downlink signals at a given channel. The test host my direct a selected DUT to transmit uplink signals at the given channel or at a selected channel that is different from the given channel. The test unit may be used to perform desired measurement on the uplink signals transmitted from the selected DUT.
摘要:
A test station may include a test host, a signal generator, and a test chamber. Multiple devices under test (DUTs) may be placed in the test chamber during device characterization operations. Radio-frequency signals may be conveyed from the signal generator to the multiple DUTs using a radiated arrangement through an antenna in the test chamber. The signal generator may broadcast downlink test signals. The DUTs may synchronize with the downlink test signals and measure radio-frequency performance levels while receiving the downlink test signals. The test host may direct the signal generator to gradually lower its output power level. The DUTs may be used to determine downlink sensitivity by monitoring the measured radio-frequency performance levels as the output power level of the signal generator is lowered. Downlink sensitivity testing may be performed across any desired radio-frequency bands and channels.
摘要:
Electronic devices with wireless communications capabilities are provided. The electronic device may include storage and processing circuitry, power amplifier circuitry, power supply circuitry, etc. The storage and processing circuitry may direct the power amplifier circuitry to operate using a desired gain mode, in a particular radio channel, and at a given output power level. The power supply circuitry may bias the power amplifier circuitry with a power supply voltage. The performance of the power amplifier circuitry may be characterized by an adjacent channel leakage ratio (ACLR) margin. The power consumption of the power amplifier circuitry may be characterized by a current savings ratio. A cost function may be calculated by taking the product of the ACLR margin and current savings ratio. A minimum point for each cost function curve may be determined. It is desirable to bias the power amplifier circuitry with a supply voltage corresponding to the minimum point.
摘要:
A test station may include a test host, a signal generator, and a test chamber. Multiple devices under test (DUTs) may be placed in the test chamber during production testing. Radio-frequency signals may be conveyed from the signal generator to the multiple DUTs using a conducted arrangement through a radio-frequency signal splitter circuit or using a radiated arrangement through an antenna in the test chamber. The signal generator may broadcast initialization downlink signals. The multiple DUTs may synchronize with the initialing downlink signals. The signal generator may broadcast test downlink signals at a target output power level. The multiple DUTs may receive the test downlink signals and compute a corresponding downlink transmission performance level based on the received downlink signals. A given DUT is marked as a passing DUT if the downlink performance level is satisfactory. A given DUT may be retested if the downlink performance level fails design criteria.
摘要:
Electronic devices with wireless communications capabilities are provided. The electronic device may include storage and processing circuitry, power amplifier circuitry, power supply circuitry, etc. The storage and processing circuitry may direct the power amplifier circuitry to operate using a desired gain mode, in a particular radio channel, and at a given output power level. The power supply circuitry may bias the power amplifier circuitry with a power supply voltage. The performance of the power amplifier circuitry may be characterized by an adjacent channel leakage ratio (ACLR) margin. The power consumption of the power amplifier circuitry may be characterized by a current savings ratio. A cost function may be calculated by taking the product of the ACLR margin and current savings ratio. A minimum point for each cost function curve may be determined. It is desirable to bias the power amplifier circuitry with a supply voltage corresponding to the minimum point.
摘要:
A test station may include a test host, a signal generator, and a test chamber. Multiple devices under test (DUTs) may be placed in the test chamber during production testing. Radio-frequency signals may be conveyed from the signal generator to the multiple DUTs using a conducted arrangement through a radio-frequency signal splitter circuit or using a radiated arrangement through an antenna in the test chamber. The signal generator may broadcast initialization downlink signals. The multiple DUTs may synchronize with the initialing downlink signals. The signal generator may broadcast test downlink signals at a target output power level. The multiple DUTs may receive the test downlink signals and compute a corresponding downlink transmission performance level based on the received downlink signals. A given DUT is marked as a passing DUT if the downlink performance level is satisfactory. A given DUT may be retested if the downlink performance level fails design criteria.
摘要:
A test station may include a test host, a signal generator, and a test chamber. Multiple devices under test (DUTs) may be placed in the test chamber during device characterization operations. Radio-frequency signals may be conveyed from the signal generator to the multiple DUTs using a radiated arrangement through an antenna in the test chamber. The signal generator may broadcast downlink test signals. The DUTs may synchronize with the downlink test signals and measure radio-frequency performance levels while receiving the downlink test signals. The test host may direct the signal generator to gradually lower its output power level. The DUTs may be used to determine downlink sensitivity by monitoring the measured radio-frequency performance levels as the output power level of the signal generator is lowered. Downlink sensitivity testing may be performed across any desired radio-frequency bands and channels.
摘要:
One or more acoustic transducers of a device may be adjusted based on automatic detection of device proximity to the user. In a mobile telephone, when the user is using the receiver and holding the telephone against his/her ear, if the telephone detects that the user has moved the telephone further from his/her ear, the telephone will raise the receiver volume. Similarly, if the user is using the speaker, the telephone will adjust the speaker volume as user distance from the telephone changes. In another embodiment the telephone may fade between the receiver and the speaker. Volume is not the only acoustic property that could be adjusted according to user proximity. Frequency response is another property that could be adjusted, such as using appropriate electronic filtering, or by turning on another transducer that is not otherwise being used.