Programmable logic device with built in self test
    1.
    发明授权
    Programmable logic device with built in self test 有权
    可编程逻辑器件内置自检

    公开(公告)号:US07944765B1

    公开(公告)日:2011-05-17

    申请号:US12626289

    申请日:2009-11-25

    IPC分类号: G11C29/00

    摘要: In one embodiment of the invention, an integrated circuit such as a programmable logic device includes volatile memory, nonvolatile memory, and a data shift register for reading data from the nonvolatile memory and for reading data from and writing data to the volatile memory. A built in self test (BIST) circuit is operable to test the nonvolatile memory without the data shift register reading data from the nonvolatile memory. The BIST circuit may include a finite state machine for performing at least one of the following tests on the nonvolatile memory: bulk erase, bulk program; margin bulk program; and/or margin bulk erase. A memory controller responsive to the finite state machine is operable to write data to and read data from the nonvolatile memory during testing of the nonvolatile memory.

    摘要翻译: 在本发明的一个实施例中,诸如可编程逻辑器件的集成电路包括易失性存储器,非易失性存储器和用于从非易失性存储器读取数据并用于从易失性存储器读取数据并将数据写入到易失性存储器的数据移位寄存器。 内置自检(BIST)电路可用于测试非易失性存储器,而数据移位寄存器从非易失性存储器读取数据。 BIST电路可以包括用于对非易失性存储器执行以下测试中的至少一个的有限状态机:批量擦除,批量程序; 保证金批发方案; 和/或边缘批量擦除。 响应于有限状态机的存储器控​​制器可用于在非易失性存储器的测试期间将数据写入非易失性存储器并从其读取数据。

    Programmable logic device with built in self test
    2.
    发明授权
    Programmable logic device with built in self test 有权
    可编程逻辑器件内置自检

    公开(公告)号:US07630259B1

    公开(公告)日:2009-12-08

    申请号:US11959329

    申请日:2007-12-18

    IPC分类号: G11C29/00

    摘要: Various techniques are described to test memory arrays of a programmable logic device (PLD). In one example, a PLD includes a first memory array. The PLD also includes a plurality of sense amplifiers adapted to read a plurality of data values stored by the first memory array and provide a plurality of data signals corresponding to the data values. The PLD further includes a test circuit adapted to test the first memory array. The test circuit is coupled with the sense amplifiers and adapted to compare the data signals with a test signal to provide a pass/fail signal. In addition, the PLD includes a second memory array. The PLD also includes a data shift register adapted to test the second memory array.

    摘要翻译: 描述了各种技术来测试可编程逻辑器件(PLD)的存储器阵列。 在一个示例中,PLD包括第一存储器阵列。 PLD还包括多个读出放大器,用于读取由第一存储器阵列存储的多个数据值,并提供对应于数据值的多个数据信号。 PLD还包括适于测试第一存储器阵列的测试电路。 测试电路与读出放大器耦合,并且适于将数据信号与测试信号进行比较以提供通过/失败信号。 此外,PLD包括第二存储器阵列。 PLD还包括适于测试第二存储器阵列的数据移位寄存器。

    Selective programming of non-volatile memory facilitated by security fuses
    3.
    发明授权
    Selective programming of non-volatile memory facilitated by security fuses 有权
    通过安全保险丝促进非易失性存储器的选择性编程

    公开(公告)号:US07623378B1

    公开(公告)日:2009-11-24

    申请号:US11416881

    申请日:2006-05-02

    IPC分类号: G11C11/04

    摘要: Methods and devices are disclosed herein to provide improved techniques for securing configuration data stored in non-volatile memories of programmable logic devices. For example, in accordance with an embodiment of the present invention, a programmable logic device includes a non-volatile memory adapted to store a plurality of configuration data. A plurality of security fuses are adapted to store a plurality of logic states. Control logic is adapted to selectively secure the configuration data within the non-volatile memory based on the logic states stored in the plurality of security fuses.

    摘要翻译: 本文公开的方法和装置提供用于保护存储在可编程逻辑器件的非易失性存储器中的配置数据的改进技术。 例如,根据本发明的实施例,可编程逻辑器件包括适于存储多个配置数据的非易失性存储器。 多个安全保险丝适于存储多个逻辑状态。 控制逻辑适于基于存储在多个安全保险丝中的逻辑状态来选择性地将配置数据保护在非易失性存储器内。

    Key Generation For Advanced Encryption Standard (AES) Decryption And The Like
    4.
    发明申请
    Key Generation For Advanced Encryption Standard (AES) Decryption And The Like 有权
    高级加密标准(AES)解密等等的密钥生成

    公开(公告)号:US20080019504A1

    公开(公告)日:2008-01-24

    申请号:US11425273

    申请日:2006-06-20

    IPC分类号: H04L9/28

    CPC分类号: H04L9/0631 H04L2209/125

    摘要: An apparatus for generating round-key words in accordance with a Rijndael algorithm. In one embodiment of the invention, the apparatus includes (a) a key expansion register block, having a key expansion register adapted to receive a final cipher key of a key expansion schedule in accordance with the Rijndael algorithm; (b) a round constant generator; (c) a first XOR adder adapted to add a first word of the key expansion register to a second word to generate and provide a first sum to the key expansion register block; (d) a transformation block adapted to generate a transformed word based on the first sum and the current round constant over four counts of a first cyclical counter; and (e) a second XOR adder adapted to add the transformed word to the first word of the key expansion register to generate and provide a second sum to the key expansion register block.

    摘要翻译: 一种用于根据Rijndael算法生成圆键字的装置。 在本发明的一个实施例中,该装置包括(a)密钥扩展寄存器块,其具有密钥扩展寄存器,该密钥扩展寄存器适于根据Rijndael算法接收密钥扩展调度的最终密码密钥; (b)圆形恒定发电机; (c)第一XOR加法器,其适于将密钥扩展寄存器的第一字添加到第二字以产生并向密钥扩展寄存器块提供第一和; (d)适于根据第一周期计数器的四个计数基于第一和和当前循环常数生成变换字的变换块; 以及(e)第二XOR加法器,其适用于将所述变换的字添加到所述密钥扩展寄存器的第一个字,以产生并向所述密钥扩展寄存器块提供第二和。

    Selective loading of configuration data into configuration memory cells
    5.
    发明授权
    Selective loading of configuration data into configuration memory cells 有权
    将配置数据选择性地加载到配置存储单元中

    公开(公告)号:US07579865B1

    公开(公告)日:2009-08-25

    申请号:US12186027

    申请日:2008-08-05

    IPC分类号: H03K19/173

    CPC分类号: H03K19/1776 H03K19/17764

    摘要: In one embodiment, a programmable logic device (PLD) such as a field programmable gate array (FPGA) includes a non-volatile memory adapted to store a first bit, a second bit, and a plurality of configuration data. A plurality of configuration memory cells within the PLD is adapted to receive configuration data transferred from the non-volatile memory. The PLD further includes control logic adapted to determine based on the logic states of the first and second bits stored in the non-volatile memory and prior to any transfer of the configuration data whether to transfer the configuration data from the non-volatile memory to the configuration memory cells.

    摘要翻译: 在一个实施例中,诸如现场可编程门阵列(FPGA)的可编程逻辑器件(PLD)包括适于存储第一位,第二位和多个配置数据的非易失性存储器。 PLD内的多个配置存储器单元适于接收从非易失性存储器传送的配置数据。 PLD还包括控制逻辑,其适于基于存储在非易失性存储器中的第一和第二位的逻辑状态确定并且在配置数据的任何传送之前是否将配置数据从非易失性存储器传送到 配置存储单元。

    Key generation for advanced encryption standard (AES) Decryption and the like
    6.
    发明授权
    Key generation for advanced encryption standard (AES) Decryption and the like 有权
    高级加密标准(AES)的密钥生成解密等

    公开(公告)号:US07702100B2

    公开(公告)日:2010-04-20

    申请号:US11425273

    申请日:2006-06-20

    IPC分类号: H04L9/28 H04L9/06

    CPC分类号: H04L9/0631 H04L2209/125

    摘要: An apparatus for generating round-key words in accordance with a Rijndael algorithm. In one embodiment of the invention, the apparatus includes (a) a key expansion register block, having a key expansion register adapted to receive a final cipher key of a key expansion schedule in accordance with the Rijndael algorithm; (b) a round constant generator; (c) a first XOR adder adapted to add a first word of the key expansion register to a second word to generate and provide a first sum to the key expansion register block; (d) a transformation block adapted to generate a transformed word based on the first sum and the current round constant over four counts of a first cyclical counter; and (e) a second XOR adder adapted to add the transformed word to the first word of the key expansion register to generate and provide a second sum to the key expansion register block.

    摘要翻译: 一种用于根据Rijndael算法生成圆键字的装置。 在本发明的一个实施例中,该装置包括(a)密钥扩展寄存器块,其具有密钥扩展寄存器,该密钥扩展寄存器适于根据Rijndael算法接收密钥扩展调度的最终密码密钥; (b)圆形恒定发电机; (c)第一XOR加法器,其适于将密钥扩展寄存器的第一字添加到第二字以产生并向密钥扩展寄存器块提供第一和; (d)适于根据第一周期计数器的四个计数基于第一和和当前循环常数生成变换字的变换块; 以及(e)第二XOR加法器,其适用于将所述变换的字添加到所述密钥扩展寄存器的第一个字,以产生并向所述密钥扩展寄存器块提供第二和。

    Selective loading of configuration data into configuration memory cells
    7.
    发明授权
    Selective loading of configuration data into configuration memory cells 有权
    将配置数据选择性地加载到配置存储单元中

    公开(公告)号:US07411417B1

    公开(公告)日:2008-08-12

    申请号:US11442186

    申请日:2006-05-26

    IPC分类号: H03K19/173

    CPC分类号: H03K19/1776 H03K19/17764

    摘要: Systems and methods are disclosed herein to provide improved techniques for loading of configuration memory cells in integrated circuits, such as programmable logic devices. For example, in accordance with an embodiment of the present invention, a programmable logic device includes a non-volatile memory adapted to store a first bit, a second bit, and a plurality of configuration data; a plurality of configuration memory cells; and control logic adapted to determine based on values of the first and second bits whether to load the configuration data from the non-volatile memory into the configuration memory cells.

    摘要翻译: 本文公开了系统和方法,以提供用于在诸如可编程逻辑器件的集成电路中加载配置存储器单元的改进技术。 例如,根据本发明的实施例,可编程逻辑器件包括适于存储第一位,第二位和多个配置数据的非易失性存储器; 多个配置存储单元; 以及适于基于第一和第二位的值来确定是否将配置数据从非易失性存储器加载到配置存储器单元中的控制逻辑。

    Testing embedded memory in an integrated circuit
    8.
    发明授权
    Testing embedded memory in an integrated circuit 有权
    在集成电路中测试嵌入式存储器

    公开(公告)号:US07484144B2

    公开(公告)日:2009-01-27

    申请号:US10929199

    申请日:2004-08-30

    申请人: Wei Han Loren McLaury

    发明人: Wei Han Loren McLaury

    IPC分类号: G11C29/00 G11C7/00 G06F11/00

    CPC分类号: G11C29/38 G11C2029/0401

    摘要: An integrated circuit includes a first bus and at least one array of embedded memories. Each array includes a second bus such as a bidirectional bus coupled to the embedded memories and to the first bus such that test vectors in the form of data words can be written from the first bus to selected embedded memories in the array. Also included is a built-in-self-test (BIST) circuit operable to compare data words on the first bus to data words read back from the selected embedded memories through the bidirectional bus.

    摘要翻译: 集成电路包括第一总线和至少一个嵌入式存储器阵列。 每个阵列包括第二总线,例如耦合到嵌入式存储器和第一总线的双向总线,使得数据字形式的测试向量可以从第一总线写入阵列中的选定的嵌入存储器。 还包括内置自检(BIST)电路,其可操作以将第一总线上的数据字与通过双向总线从选定的嵌入存储器读回的数据字进行比较。

    Testing embedded memory in an integrated circuit

    公开(公告)号:US20060059386A1

    公开(公告)日:2006-03-16

    申请号:US10929199

    申请日:2004-08-30

    申请人: Wei Han Loren McLaury

    发明人: Wei Han Loren McLaury

    IPC分类号: G06F11/00

    CPC分类号: G11C29/38 G11C2029/0401

    摘要: An integrated circuit includes a first bus and at least one array of embedded memories. Each array includes a second bus such as a bidirectional bus coupled to the embedded memories and to the first bus such that test vectors in the form of data words can be written from the first bus to selected embedded memories in the array. Also included is a built-in-self-test (BIST) circuit operable to compare data words on the first bus to data words read back from the selected embedded memories through the bidirectional bus.

    Flexible updating of multi-bit registers
    10.
    发明授权
    Flexible updating of multi-bit registers 有权
    灵活更新多位寄存器

    公开(公告)号:US08441284B1

    公开(公告)日:2013-05-14

    申请号:US13154885

    申请日:2011-06-07

    IPC分类号: H03K19/173

    CPC分类号: H03K19/17752

    摘要: Various techniques are provided to flexibly update data fields stored in multi-bit registers. In one example, a method of updating a control register within an integrated circuit includes storing a plurality of initial bit values in the control register within the integrated circuit. The method also includes receiving a data set comprising one or more corrective bit values and one or more non-corrective bit values. The method also includes performing a logic operation on the received data set and the initial bit values to provide updated bit values. The method also includes replacing the initial bit values with the updated bit values in the control register.

    摘要翻译: 提供各种技术来灵活地更新存储在多位寄存器中的数据字段。 在一个示例中,更新集成电路内的控制寄存器的方法包括将多个初始位值存储在集成电路内的控制寄存器中。 该方法还包括接收包括一个或多个校正位值和一个或多个非校正位值的数据集。 该方法还包括对所接收的数据集和初始位值执行逻辑运算以提供更新的位值。 该方法还包括用控制寄存器中更新的位值替换初始位值。