公开(公告)号：US20090195264A1

公开(公告)日：2009-08-06

申请号：US12012560

申请日：2008-02-04

申请人： Wen-Yuan Tsen ,  Guei-Tang Huang ,  Sung-Rong Shu ,  Wan-Te Hung ,  Chih-Wei Lee ,  Su-Hui Wang ,  Chih-Hung Huang

发明人： Wen-Yuan Tsen ,  Guei-Tang Huang ,  Sung-Rong Shu ,  Wan-Te Hung ,  Chih-Wei Lee ,  Su-Hui Wang ,  Chih-Hung Huang

IPC分类号： G01R31/02

CPC分类号： G01R31/2867 ,  G01R31/2875

摘要： A high temperature test system is adapted for testing a device under test (DUT) under a high temperature environment. The high temperature test system includes a preheating unit, a first moving unit, a testing unit, and a second moving unit. The preheating unit is adapted for preheating the DUT. The first moving unit is adapted for removing the preheated DUT from the preheating unit. The testing unit is adapted for placement of the DUT removed by the first moving unit, for testing the DUT, and for providing the high temperature environment to the DUT during testing. The second moving unit is adapted for removing the DUT that has passed testing from the testing unit.

摘要翻译： 高温测试系统适用于在高温环境下测试被测设备（DUT）。 高温测试系统包括预热单元，第一移动单元，测试单元和第二移动单元。 预热单元适用于预热DUT。 第一移动单元适于从预热单元去除预热的DUT。 测试单元适于放置由第一移动单元去除的DUT，用于测试DUT，以及在测试期间向DUT提供高温环境。 第二移动单元适于去除已经通过测试的测试单元的DUT。