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公开(公告)号：US5772861A
公开(公告)日：1998-06-30
申请号：US541201
申请日：1995-10-16
申请人： William A. Meredith, Jr. , Charles C. Gammans , Kelly R. Clayton , Erik J. Bjornard , Kim D. Powers
发明人： William A. Meredith, Jr. , Charles C. Gammans , Kelly R. Clayton , Erik J. Bjornard , Kim D. Powers
CPC分类号： C23C14/56 , C23C14/545 , C23C14/547
摘要： A system for evaluating the reflectance of an object (e.g., a CRT) that is coated with an anti-reflective coating material is disclosed. The quality and/or uniformity of the coating is evaluated by a reflectometer. The reflectometer is positioned relative to the object by non-contact sensors. Reflectance data gathered by the reflectometer is analyzed to determine to what extent the actual coating differs from the optimal (i.e., ideal) coating. A feedback system modifies the coating process for subsequent objects in an attempt to fine-tune the coating process and achieve optimal anti-reflective coatings for later objects passing through the system.
摘要翻译： 公开了一种用于评估涂覆有抗反射涂层材料的物体（例如CRT）的反射率的系统。 通过反射计评价涂层的质量和/或均匀性。 反射计通过非接触传感器相对于物体定位。 分析由反射计收集的反射率数据，以确定实际涂层在何种程度上与最佳（即理想）涂层不同。 反馈系统修改后续物体的涂覆过程，以试图微调涂层工艺，并为后续物体通过系统获得最佳的抗反射涂层。
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公开(公告)号：US6128087A
公开(公告)日：2000-10-03
申请号：US74843
申请日：1998-05-08
申请人： William A. Meredith, Jr. , Charles C. Gammans , Kelly R. Clayton , Erik J. Bjornard , Kim D. Powers
发明人： William A. Meredith, Jr. , Charles C. Gammans , Kelly R. Clayton , Erik J. Bjornard , Kim D. Powers
CPC分类号： C23C14/56 , C23C14/545 , C23C14/547
摘要： A system for evaluating the reflectance of an object (e.g., a CRT) that is coated with an anti-reflective coating material is disclosed. The quality and/or uniformity of the coating is evaluated by a reflectometer. The reflectometer is positioned relative to the object by non-contact sensors. Reflectance data gathered by the reflectometer is analyzed to determine to what extent the actual coating differs from the optimal (i.e., ideal) coating. A feedback system modifies the coating process for subsequent objects in an attempt to fine-tune the coating process and achieve optimal anti-reflective coatings.
摘要翻译： 公开了一种用于评估涂覆有抗反射涂层材料的物体（例如CRT）的反射率的系统。 通过反射计评价涂层的质量和/或均匀性。 反射计通过非接触传感器相对于物体定位。 分析由反射计收集的反射率数据，以确定实际涂层在何种程度上与最佳（即理想）涂层不同。 反馈系统改变后续物体的涂覆过程，以试图微调涂层工艺并实现最佳的抗反射涂层。
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