专利检索 ap:("X-RAY OPTICAL SYSTEMS, INC.") AND inv:"Andrew Hider" 第 1 页

1.

发明授权
Active, variable sample concentration method and apparatus for sub-ppb measurements and exemplary X-ray analysis applications thereof 有权

公开(公告)号：US10317350B2

公开(公告)日：2019-06-11

申请号：US15314620

申请日：2015-05-29

申请人： X-RAY OPTICAL SYSTEMS, INC.

发明人： Zewu Chen , George Allen , Andrew Hider , Danhong Li , Jon Dunphy , Joseph Spinazola

IPC分类号： G01N23/223 , G01N33/18

摘要： A sample handling apparatus/technique/method for a material analyzer, which provides active, variable concentration of a sample, using a measurement marker introduced into the sample, to measurably concentrate an analyte in a liquid (e.g., water) sample. Active, variable concentration allows otherwise lower level analytes to be concentrated in a measurable way. This enables measurements at higher (e.g., concentrated) levels, which can be extrapolated to obtain their lower, original levels based on the concentration level—measured using the introduced marker as a guide. The sample handling apparatus may be used in combination with an optic-enabled x-ray analyzer, the x-ray analyzer including an x-ray engine with an x-ray excitation path and an x-ray detection path, usable during both during the concentration and analyte measurement.