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    System and method for inspection of films
    5.
    发明申请
    System and method for inspection of films 审中-公开
    电影检查系统及方法

    公开(公告)号：US20070115464A1

    公开(公告)日：2007-05-24

    申请号：US11285332

    申请日：2005-11-21

    申请人： Kevin Harding ,  Robert Tait ,  Mark Cheverton

    发明人： Kevin Harding ,  Robert Tait ,  Mark Cheverton

    IPC分类号： G01N21/88

    CPC分类号： G01N21/958 ,  G01N2021/8825

    摘要： Disclosed herein is a method for inspection of light management films with a plurality of light refractive surface structures, including positioning at least one illumination source, and at least one imaging device are configured to be in a substantially bright field configuration and imaging at least portion of the light management film to provide an acquired image, wherein light from the at least one illumination source is refracted by the film to produce a dark field image at the at least one imaging device. A system for inspection of light management films is also provided. The system includes at least one illumination source to illuminate a first side of the film, at least one imaging device to receive light refracted through an opposite side of the light management film, wherein the illumination source and the imaging device are configured to be in a substantially bright field configuration to acquire a dark field image, a processor-controller, and a computer-readable medium including instructions for automated defect detection. The fixture, the illumination source, the imaging device, the processor-controller and the computer readable medium are operably coupled for automated defect detection.

    摘要翻译： 本文公开了一种用于检查具有多个光折射表面结构的光管理膜的方法，包括定位至少一个照明源，并且至少一个成像装置被配置为处于基本上明亮的场配置并且成像至少部分 所述光管理膜提供获取的图像，其中来自所述至少一个照明源的光被所述胶片折射以在所述至少一个成像装置处产生暗视场图像。 还提供了一种用于检查光管理膜的系统。 所述系统包括至少一个照明源以照亮所述胶片的第一面，至少一个成像装置，用于接收通过所述光管理膜的相对侧折射的光，其中所述照明源和所述成像装置被配置为处于 用于获取暗视场图像的基本上明亮的场配置，处理器控制器和包括用于自动缺陷检测的指令的计算机可读介质。 固定装置，照明源，成像装置，处理器控制器和计算机可读介质可操作地耦合用于自动缺陷检测。

    System and method for detecting repeating defects in a light-management film
    7.
    发明授权
    System and method for detecting repeating defects in a light-management film 有权
    用于检测光管理膜中的重复缺陷的系统和方法

    公开(公告)号：US07435986B2

    公开(公告)日：2008-10-14

    申请号：US11609605

    申请日：2006-12-12

    申请人： Kevin Patrick Capaldo ,  Mark Cheverton ,  Kevin George Harding ,  Robert Tait

    发明人： Kevin Patrick Capaldo ,  Mark Cheverton ,  Kevin George Harding ,  Robert Tait

    IPC分类号： G01N21/86 ,  H01L27/00

    CPC分类号： G01N21/95 ,  G01N2021/9513

    摘要： A system and a method for detecting defects in a light-management film are provided. The system includes a first light source configured to emit light onto a first side of the film in a first predetermined region of the film. The system further includes a second light source configured to emit light onto a second side of the film in the first predetermined region of the film. The system further includes a first camera configured to receive a first portion of light reflected from the first predetermined region of film from the first light source and a second portion of the light propagating through the film from the second light source. Finally, the system includes a signal-processing device openably coupled to the first camera configured to detect a defect in the first predetermined region of the film based on at least one of the first and second portions of light.

    摘要翻译： 提供了一种用于检测光管理膜中的缺陷的系统和方法。 该系统包括配置成在膜的第一预定区域中将光发射到膜的第一侧上的第一光源。 该系统还包括被配置为在薄膜的第一预定区域中将光发射到薄膜的第二侧上的第二光源。 该系统还包括第一照相机，其配置为从第一光源接收从第一预定区域反射的光的第一部分，以及从第二光源传播通过膜的光的第二部分。 最后，该系统包括可开启地耦合到第一照相机的信号处理设备，其被配置为基于第一和第二光部分中的至少一个来检测胶片的第一预定区域中的缺陷。

    SYSTEM AND METHOD FOR DETECTING DEFECTS IN A LIGHT-MANAGEMENT FILM
    8.
    发明申请
    SYSTEM AND METHOD FOR DETECTING DEFECTS IN A LIGHT-MANAGEMENT FILM 有权
    用于检测光管理膜中的缺陷的系统和方法

    公开(公告)号：US20070083577A1

    公开(公告)日：2007-04-12

    申请号：US11609605

    申请日：2006-12-12

    申请人： Kevin Capaldo ,  Mark Cheverton ,  Kevin Harding ,  Robert Tait

    发明人： Kevin Capaldo ,  Mark Cheverton ,  Kevin Harding ,  Robert Tait

    IPC分类号： G06F15/00

    CPC分类号： G01N21/95 ,  G01N2021/9513

    摘要： A system and a method for detecting defects in a light-management film are provided. The system includes a first light source configured to emit light onto a first side of the film in a first predetermined region of the film. The system further includes a second light source configured to emit light onto a second side of the film in the first predetermined region of the film. The system further includes a first camera configured to receive a first portion of light reflected from the first predetermined region of film from the first light source and a second portion of the light propagating through the film from the second light source. Finally, the system includes a signal-processing device openably coupled to the first camera configured to detect a defect in the first predetermined region of the film based on at least one of the first and second portions of light.

    摘要翻译： 提供了一种用于检测光管理膜中的缺陷的系统和方法。 该系统包括配置成在膜的第一预定区域中将光发射到膜的第一侧上的第一光源。 该系统还包括被配置为在薄膜的第一预定区域中将光发射到薄膜的第二侧上的第二光源。 该系统还包括第一照相机，其配置为从第一光源接收从第一预定区域反射的光的第一部分，以及从第二光源传播通过膜的光的第二部分。 最后，该系统包括可开启地耦合到第一照相机的信号处理设备，其被配置为基于第一和第二光部分中的至少一个来检测胶片的第一预定区域中的缺陷。

    Method for examining molds and apparatus for accomplishing the same
    9.
    发明申请
    Method for examining molds and apparatus for accomplishing the same 审中-公开
    用于检查模具的方法和用于实现模具的装置

    公开(公告)号：US20070115460A1

    公开(公告)日：2007-05-24

    申请号：US11285329

    申请日：2005-11-21

    申请人： Kevin Capaldo ,  Mark Cheverton

    发明人： Kevin Capaldo ,  Mark Cheverton

    IPC分类号： G01N21/00

    CPC分类号： G01N21/956 ,  G02B5/045

    摘要： Disclosed herein is a defect detection apparatus comprising a first light source that emits light in a direction parallel to an apex of prismatic structures disposed on a mold; wherein an angle between a central axis of a beam of light emitted by the first light source and a vertical taken at the first light source is about 20 to about 90 degrees; a second light source that emits light in a direction perpendicular to the apex of the prismatic structures disposed on the mold; wherein an angle between a central axis of a beam of light emitted by the second light source and a vertical taken at the second light source is less than 45 degrees; a sample holder for holding the mold; a camera placed directly above the sample holder; and translational stages for supporting the camera and the sample holder.

    摘要翻译： 本发明公开了一种缺陷检测装置，包括：第一光源，其在平行于设置在模具上的棱镜结构的顶点的方向上发光; 其中由所述第一光源发射的光束的中心轴线与在所述第一光源处拍摄的垂直线之间的角度为约20度至约90度; 第二光源，其在垂直于设置在模具上的棱镜结构的顶点的方向上发光; 其中由所述第二光源发射的光束的中心轴线与在所述第二光源处拍摄的垂直线之间的角度小于45度; 用于保持模具的样品架; 放置在样品架上方的相机; 以及用于支持相机和样品架的平移阶段。