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1.发明授权公开(公告)号：US07053647B2
公开(公告)日：2006-05-30
申请号：US10841083
申请日：2004-05-07
申请人： Yue-Der Chih , Ping-Chun Tai
发明人： Yue-Der Chih , Ping-Chun Tai
CPC分类号： G11C29/025 , G11C29/02
摘要： A method and system for detecting a potential reliability problem cause by electrical bridging in an integrated circuit. A voltage difference is created between two conducting lines in the integrated circuit to accelerate the bridging effect for a predetermined period of time. The conducting lines are detected to determine whether an undesired connection has occurred due to the bridging effect between the conducting lines.
摘要翻译： 一种用于检测由集成电路中的电桥引起的潜在可靠性问题的方法和系统。 在集成电路中的两个导线之间产生电压差以加速桥接效应达预定时间段。 检测导线以确定由于导线之间的桥接效应是否发生了不期望的连接。
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2.发明申请METHOD AND SYSTEM FOR DETECTING POTENTIAL RELIABILITY FAILURES OF INTEGRATED CIRCUIT 审中-公开用于检测集成电路的潜在可靠性故障的方法和系统公开(公告)号：US20060176067A1
公开(公告)日：2006-08-10
申请号：US11279918
申请日：2006-04-17
申请人： Yue-Der Chih , Ping-Chun Tai
发明人： Yue-Der Chih , Ping-Chun Tai
IPC分类号： G01R31/26
CPC分类号： G11C29/025 , G11C29/02
摘要： A method and system for detecting a potential reliability problem cause by electrical bridging in an integrated circuit. A voltage difference is created between two conducting lines in the integrated circuit to accelerate the bridging effect for a predetermined period of time. The conducting lines are detected to determine whether an undesired connection has occurred due to the bridging effect between the conducting lines.
摘要翻译： 一种用于检测由集成电路中的电桥引起的潜在可靠性问题的方法和系统。 在集成电路中的两个导线之间产生电压差以加速桥接效应达预定时间段。 检测导线以确定由于导线之间的桥接效应是否发生了不期望的连接。
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3.发明申请Method and system for detecting potential reliability failures of integrated circuit 有权集成电路潜在可靠性故障检测方法及系统公开(公告)号：US20050248352A1
公开(公告)日：2005-11-10
申请号：US10841083
申请日：2004-05-07
申请人： Yue-Der Chih , Ping-Chun Tai
发明人： Yue-Der Chih , Ping-Chun Tai
CPC分类号： G11C29/025 , G11C29/02
摘要： A method and system for detecting a potential reliability problem cause by electrical bridging in an integrated circuit. A voltage difference is created between two conducting lines in the integrated circuit to accelerate the bridging effect for a predetermined period of time. The conducting lines are detected to determine whether an undesired connection has occurred due to the bridging effect between the conducting lines.
摘要翻译： 一种用于检测由集成电路中的电桥引起的潜在可靠性问题的方法和系统。 在集成电路中的两个导线之间产生电压差以加速桥接效应达预定时间段。 检测导线以确定由于导线之间的桥接效应是否发生了不期望的连接。
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