公开(公告)号：US5854795A

公开(公告)日：1998-12-29

申请号：US801919

申请日：1997-02-14

Applicant: Yuichi Osano

Inventor： Yuichi Osano

IPC: G06F12/16 ,  G06F11/22 ,  G06F12/06 ,  G11C29/08 ,  G11C29/00

CPC classification number: G06F11/2247 ,  G11C29/08

Abstract: A memory capacity test method capable of confirming the memory capacity of an actually mounted memory in a short time in a memory system which mounts a memory only on a portion of a memory space. The method writes first data to a check address which is an n-th power of two, and then second data to the address 0, where the second data differs from the first data, and decides that the memory is not mounted on the check address if the data read from the check address disagrees with the first data. This is based on the fact that the check address actually points the address 0 when the memory is not mounted on the check address of the nth power of two, and hence the second data is written over the first data on the address 0 in that case.

Abstract translation: 一种存储器容量测试方法，其能够在仅将存储器仅在存储器空间的一部分上安装存储器的存储器系统中在短时间内确认实际安装的存储器的存储器容量。 该方法将第一数据写入检查地址，该检查地址是二次的第二次，然后将第二数据写入地址0，其中第二数据与第一数据不同，并且确定存储器未被安装在检查地址 如果从检查地址读取的数据不符合第一个数据。 这是基于以下事实：当存储器未被安装在二次的第n个功率的检查地址上时，检查地址实际上指向地址0，因此在这种情况下第二数据被写入地址0上的第一数据 。