公开(公告)号：US20230400635A1

公开(公告)日：2023-12-14

申请号：US18033891

申请日：2021-10-27

Applicant: ZTE CORPORATION

Inventor： Xiaolin CHEN ,  Hao TIAN ,  Yonghui REN ,  Bi YI

IPC: G02B6/125 ,  G01M11/00

CPC classification number: G02B6/125 ,  G01M11/33

Abstract: Provided are a method for determining parameters of a waveguide core in an optical-electronic printed circuit board, an optical-electronic printed circuit board, an electronic device, and a storage medium. The method includes: determining, according to a refractive index of a material from which the waveguide core is made and a refractive index of a material from which a base layer is made, a critical angle of total reflection at an interface between the waveguide core and the base layer; and determining the parameters of the waveguide core according to a relative positional relationship between one end port of the waveguide core and the other end port of the waveguide core in the optical-electronic printed circuit board, a condition of a region through which the waveguide core passes, and the critical angle, so that steering of the waveguide core is achieved without introducing a curved surface to the waveguide core.