AUTOMATED DEFLECTOMETRY SYSTEM FOR ASSESSING REFLECTOR QUALITY
    2.
    发明申请
    AUTOMATED DEFLECTOMETRY SYSTEM FOR ASSESSING REFLECTOR QUALITY 审中-公开
    用于评估反射器质量的自动测量系统

    公开(公告)号:US20160025591A1

    公开(公告)日:2016-01-28

    申请号:US14806627

    申请日:2015-07-22

    Applicant: esolar Inc.

    Abstract: An automated deflectometry system and method for assessing the quality of a reflective surface for use in a concentrating solar power plant. The deflectometry system comprises a holding fixture for mounting a heliostat reflector opposite a target screen having a known pattern. Digital cameras embedded in the target screen take pictures of the known pattern as reflected in the surface of the reflector. Image processing software then detects the features of the pattern in the reflector images and calculates the slope profile of the reflective surface. The slope field can be calculated by comparing the images of the reflective surface to those of a reference surface. Based on the slope profile of the reflective surface, a ray tracing calculation can be performed to simulate flux as reflected from the reflective surface onto a receiver and a quality metric can be ascribed to the heliostat reflector. The result of the quality assessment can displayed using a graphical user interface on an automated assembly line.

    Abstract translation: 一种用于评估在聚光太阳能发电厂中使用的反射表面的质量的自动偏光测量系统和方法。 偏转系统包括用于安装与具有已知图案的目标屏幕相对的定日反射器的保持夹具。 嵌入在目标屏幕中的数码相机拍摄反射器表面反射的已知图案。 图像处理软件然后检测反射器图像中的图案的特征并计算反射表面的斜率分布。 可以通过将反射表面的图像与参考表面的图像进行比较来计算斜率场。 基于反射表面的斜率分布,可以执行光线跟踪计算,以模拟从反射表面反射到接收器上的通量,并且质量度量可归因于定日镜反射器。 质量评估的结果可以使用自动装配线上的图形用户界面显示。

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