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公开(公告)号：US08607622B2
公开(公告)日：2013-12-17
申请号：US13135956
申请日：2011-07-18
申请人： Alexandre Dazzi , Rui Prazeres , Kevin Kjoller , Michael Reading
发明人： Alexandre Dazzi , Rui Prazeres , Kevin Kjoller , Michael Reading
CPC分类号： G01Q60/38 , G01N21/35 , G01N21/3563 , G01Q30/02 , G01Q60/32
摘要： An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.
摘要翻译： 已经证明了基于AFM的技术用于在样品表面上进行高度局部化的IR光谱。 在商业可行的分析仪器中实施的这种技术将是非常有用的。 必须改变实验设置的各个方面，以创建商业版本。 本发明解决了许多这些问题，从而产生了一般可用于科学界的分析技术的版本。
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2.发明授权公开(公告)号：US08242448B2
公开(公告)日：2012-08-14
申请号：US12927248
申请日：2010-11-09
申请人： Craig Prater , Michael Lo , Doug Gotthard , Anthony Kurtz , Kevin Kjoller
发明人： Craig Prater , Michael Lo , Doug Gotthard , Anthony Kurtz , Kevin Kjoller
IPC分类号： G01J5/00
CPC分类号： G01N21/3563 , G01Q30/02
摘要： Dynamic IR radiation power control, beam steering and focus adjustment for use in a nanoscale IR spectroscopy system based on an Atomic Force Microscope. During illumination with a beam from an IR source, an AFM probe tip interaction with a sample due to local IR sample absorption is monitored. The power of the illumination at the sample is dynamically decreased to minimize sample overheating in locations/wavelengths where absorption is high and increased in locations/wavelengths where absorption is low to maintain signal to noise. Beam alignment and focus optimization as a function of wavelength are automatically performed.
摘要翻译： 动态IR辐射功率控制，光束转向和聚焦调整，用于基于原子力显微镜的纳米级红外光谱系统。 在用来自IR源的光照射期间，监测由于局部IR样品吸收而导致AFM探针尖端与样品的相互作用。 动态地降低样品照度的功率，以使吸收率高的位置/波长处的样品过热度最小化，吸收低的位置/波长增加，以保持信噪比。 自动执行光束对准和聚焦优化作为波长的函数。
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