公开(公告)号：US20150034826A1

公开(公告)日：2015-02-05

申请号：US13956156

申请日：2013-07-31

申请人： Craig Prater ,  Kevin Kjoller ,  Doug Gotthard ,  Qichi Hu

发明人： Craig Prater ,  Kevin Kjoller ,  Doug Gotthard ,  Qichi Hu

IPC分类号： G01Q60/30 ,  G01N21/35

摘要： Described are techniques for obtaining spectroscopic information from sub-micron regions of a sample using a probe microscope. The current invention uses the response of an AFM cantilever at a plurality of frequencies to substantially reduce the impact of background absorption away from the sub-micron region of interest. This innovation substantially improves the quality of spectra for top down illumination of samples that are not suitable for bottoms up illumination of the prior art.

摘要翻译： 描述的是使用探针显微镜从样品的亚微米区域获得光谱信息的技术。 本发明使用AFM悬臂在多个频率下的响应基本上减少背景吸收远离感兴趣的亚微米区域的影响。 该创新大大提高了不适用于现有技术的底部照明的样品的自顶向下照射的光谱质量。

公开(公告)号：US08680467B2

公开(公告)日：2014-03-25

申请号：US13236115

申请日：2011-09-19

申请人： Craig Prater ,  Kevin Kjoller

发明人： Craig Prater ,  Kevin Kjoller

IPC分类号： G01J5/00 ,  G01Q70/08 ,  G01L9/00

CPC分类号： G01Q30/02 ,  G01N21/35 ,  G01Q60/32

摘要： A method of obtaining submicron resolution IR absorption data from a sample surface. A probe microscope probe interacts with the sample surface while a tunable source of IR radiation illuminates the sample-tip interaction region. The source is modulated at a frequency substantially overlapping the resonant frequency of the probe and may be modulated at the contact resonance frequency of the probe when the probe is in contact with the sample surface. The modulation frequency is continually adjusted to account for shifts in the probe resonant frequency due to sample or other variations. A variety of techniques are used to observe such shifts and accomplish the adjustments in a rapid manner.

摘要翻译： 从样品表面获得亚微米分辨率IR吸收数据的方法。 探针显微镜探针与样品表面相互作用，而可调谐的红外辐射源照射样品尖端相互作用区域。 源以基本上与探针的谐振频率重叠的频率被调制，并且当探针与样品表面接触时可以以探针的接触共振频率调制源。 调制频率被连续地调整以考虑由于采样或其它变化引起的探头谐振频率的偏移。 使用各种技术来观察这种转移并以快速的方式完成调整。

公开(公告)号：US20080283755A1

公开(公告)日：2008-11-20

申请号：US11803421

申请日：2007-05-15

申请人： A. Dazzi Dazzi ,  Rui Prazeres ,  Mike Reading ,  Kevin Kjoller

发明人： A. Dazzi Dazzi ,  Rui Prazeres ,  Mike Reading ,  Kevin Kjoller

IPC分类号： G01N21/84 ,  G01N25/16 ,  G01N13/16

CPC分类号： G01Q60/38 ,  G01N21/35 ,  G01N21/3563 ,  G01Q30/02 ,  G01Q60/32

摘要： An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that cab be made generally available to the scientific community.

摘要翻译： 已经证明了基于AFM的技术用于在样品表面上进行高度局部化的IR光谱。 在商业可行的分析仪器中实施的这种技术将是非常有用的。 必须改变实验设置的各个方面，以创建商业版本。 本发明解决了许多这些问题，从而产生了一般可用于科学界的驾驶室的分析技术的版本。

公开(公告)号：US08402819B2

公开(公告)日：2013-03-26

申请号：US12315859

申请日：2008-12-05

申请人： A. Dazzi Dazzi ,  Clotilde Policar ,  Kevin Kjoller ,  Michael Reading ,  Konstantin Vodopyanov ,  Craig Prater

发明人： A. Dazzi Dazzi ,  Clotilde Policar ,  Kevin Kjoller ,  Michael Reading ,  Konstantin Vodopyanov ,  Craig Prater

IPC分类号： G01B5/28 ,  G01Q80/00 ,  G01N21/84

CPC分类号： G01Q30/02 ,  G01N21/3563 ,  G01Q60/32

摘要： An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Significant issues as to size, cost of implementation, and repeatability/robustness of results exist in commercializing the technique. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.

摘要翻译： 已经证明了基于AFM的技术用于在样品表面上进行高度局部化的IR光谱。 在技​​术商业化方面存在关于规模，实施成本和结果的重复性/鲁棒性的重大问题。 本发明解决了许多这些问题，从而产生了一般可用于科学界的分析技术的版本。

公开(公告)号：US08387443B2

公开(公告)日：2013-03-05

申请号：US12558150

申请日：2009-09-11

申请人： William P. King ,  Jonathan R. Felts ,  Craig Prater ,  Kevin Kjoller

发明人： William P. King ,  Jonathan R. Felts ,  Craig Prater ,  Kevin Kjoller

IPC分类号： G01B5/28

CPC分类号： G01Q60/38 ,  G01Q60/32

摘要： Described herein are devices and methods for sensing pulsed forces. Some of the described devices and methods are also useful for measuring infrared absorbances and compiling spectral and chemical maps of surfaces. Also described are microcantilever having reduced harmonic frequencies when operating in contact mode. Some of the described microcantilevers comprise an internal resonator configured to vibrate substantially independent of friction between the microcantilever tip and a surface when the microcantilever operates in contact mode. A number of the described devices and methods are useful for monitoring pulsed forces with enhanced sensitivity.

摘要翻译： 这里描述了用于感测脉冲力的装置和方法。 所描述的装置和方法中的一些也可用于测量红外吸收和编辑表面的光谱和化学图谱。 还描述了当在接触模式下操作时具有降低的谐波频率的微型悬臂梁。 所描述的微悬臂梁中的一些包括内部谐振器，其构造成当微悬臂操作在接触模式时基本上独立于微悬臂尖端和表面之间的摩擦而振动。 所描述的装置和方法中的许多用于以增强的灵敏度监测脉冲力。

公开(公告)号：US20130036521A1

公开(公告)日：2013-02-07

申请号：US13236115

申请日：2011-09-19

申请人： Craig Prater ,  Kevin Kjoller

发明人： Craig Prater ,  Kevin Kjoller

IPC分类号： G01Q70/08

CPC分类号： G01Q30/02 ,  G01N21/35 ,  G01Q60/32

摘要： A method of obtaining submicron resolution IR absorption data from a sample surface. A probe microscope probe interacts with the sample surface while a tunable source of IR radiation illuminates the sample-tip interaction region. The source is modulated at a frequency substantially overlapping the resonant frequency of the probe and may be modulated at the contact resonance frequency of the probe when the probe is in contact with the sample surface. The modulation frequency is continually adjusted to account for shifts in the probe resonant frequency due to sample or other variations. A variety of techniques are used to observe such shifts and accomplish the adjustments in a rapid manner.

摘要翻译： 从样品表面获得亚微米分辨率IR吸收数据的方法。 探针显微镜探针与样品表面相互作用，而可调谐的红外辐射源照射样品尖端相互作用区域。 源以基本上与探针的谐振频率重叠的频率被调制，并且当探针与样品表面接触时可以以探针的接触共振频率调制源。 调制频率被连续地调整以考虑由于采样或其它变化引起的探头谐振频率的偏移。 使用各种技术来观察这种转移并以快速的方式完成调整。

公开(公告)号：US20070263696A1

公开(公告)日：2007-11-15

申请号：US11801254

申请日：2007-05-08

申请人： Kevin Kjoller ,  Azzedine Hammiche

发明人： Kevin Kjoller ,  Azzedine Hammiche

IPC分类号： G01K17/00

CPC分类号： G01Q60/58

摘要： The invention is a system and method for producing highly localized calorimetry data on a sample surface. The system is based on an SPM or other system with a probe and fine positioning capability. A heated probe is used to take a small sample (nano-sample) of a surface, and thereby make calorimetry measurements in a controlled manner.

摘要翻译： 本发明是用于在样品表面上产生高度局部化的量热数据的系统和方法。 该系统基于具有探头和精细定位能力的SPM或其他系统。 使用加热的探针来取出表面的小样品（纳米样品），从而以受控的方式进行量热测量。

公开(公告)号：US20050145021A1

公开(公告)日：2005-07-07

申请号：US11075019

申请日：2005-03-08

申请人： Ami Chand ,  Kevin Kjoller ,  Kenneth Babcock ,  Michael Harris

发明人： Ami Chand ,  Kevin Kjoller ,  Kenneth Babcock ,  Michael Harris

IPC分类号： G01B11/00 ,  G01B5/28 ,  G01B21/30 ,  G01D5/26 ,  G01Q10/02 ,  G01Q10/04 ,  G01Q10/06 ,  G01Q30/20 ,  G01Q60/00 ,  G01Q70/02 ,  G01Q70/08 ,  G01Q70/16 ,  G01Q80/00 ,  G01Q90/00 ,  G12B21/20 ,  G01N13/10

CPC分类号： G01Q70/16 ,  G01B5/28 ,  G01D5/26 ,  G01Q10/02 ,  G01Q10/04 ,  G01Q10/06 ,  G01Q70/02 ,  G01Q70/08 ,  G01Q80/00

摘要： A method and apparatus for manipulating the surface of a sample including a cantilever, a first tip mounted on the cantilever, and a second tip mounted on the cantilever, the first and the second tip being configured to combine to form an imaging probe and to separate to form a manipulation probe. The first and second tips are configured to form a first position characterized in that the tips combine to form an imaging tip and the first and the second tip are configured to form a second position characterized in that the tips separate to manipulate particles on a surface of a sample. The tips can be configured to form the first position when a voltage is applied across the tips, and preferable extend downwardly from the cantilever substantially perpendicular thereto.

摘要翻译： 一种用于操纵样品表面的方法和装置，包括悬臂，安装在悬臂上的第一尖端和安装在悬臂上的第二尖端，第一和第二尖端构造成组合以形成成像探针并分离 以形成操纵探针。 第一和第二尖端被配置成形成第一位置，其特征在于，所述尖端组合以形成成像尖端，并且所述第一和第二末端被配置成形成第二位置，其特征在于，所述尖端分离以操纵颗粒在 一个样品。 当跨越尖端施加电压时，尖端可被配置成形成第一位置，并且优选地从基本垂直于其的悬臂向下延伸。

公开(公告)号：US08646319B2

公开(公告)日：2014-02-11

申请号：US12660266

申请日：2010-02-23

申请人： Craig Prater ,  Kevin Kjoller

发明人： Craig Prater ,  Kevin Kjoller

IPC分类号： G01B5/28 ,  G01N21/84

CPC分类号： G01Q30/02

摘要： Dynamic IR radiation power control for use in a nanoscale IR spectroscopy system based on an Atomic Force Microscope. During illumination from an IR source, an AFM probe tip interaction with a sample due to local IR sample absorption is monitored. The power of the illumination at the sample is dynamically decreased to minimize sample overheating in locations/wavelengths where absorption is high and increased in locations/wavelengths where absorption is low to maintain signal to noise.

摘要翻译： 动态红外辐射功率控制，用于基于原子力显微镜的纳米级红外光谱系统。 在来自IR源的照射期间，监测由于局部IR样品吸收而导致的AFM探针尖端与样品的相互作用。 动态地降低样品照度的功率，以使吸收率高的位置/波长处的样品过热度最小化，吸收低的位置/波长增加，以保持信噪比。

公开(公告)号：US08418538B2

公开(公告)日：2013-04-16

申请号：US13289640

申请日：2011-11-04

申请人： A. Dazzi Dazzi ,  Clotilde Policar ,  Kevin Kjoller ,  Michael Reading ,  Konstantin Vodopyanov ,  Craig Prater

发明人： A. Dazzi Dazzi ,  Clotilde Policar ,  Kevin Kjoller ,  Michael Reading ,  Konstantin Vodopyanov ,  Craig Prater

IPC分类号： G01B5/28 ,  G01Q60/34 ,  G01N21/84

CPC分类号： G01Q30/02 ,  G01N21/3563 ,  G01Q60/32

摘要： An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Significant issues as to size, cost of implementation, and repeatability/robustness of results exist in commercializing the technique. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.