公开(公告)号：US06256896B1

公开(公告)日：2001-07-10

申请号：US09399029

申请日：1999-09-21

申请人： Konrad S. Landauer

发明人： Konrad S. Landauer

IPC分类号： G01G1950

CPC分类号： A61B5/107 ,  A61B5/704 ,  A61B2560/0431 ,  G01B3/08 ,  G01B5/02

摘要： An infantometer in combination with a pediatric weighing scale. The infantometer has a pediatric-scale mounting means projecting downwardly from the main frame thereof with releasable retaining means for releasably retaining the infantometer to a pediatric scale, where the infant-receiving tray of the infantometer also serves as the infant-receiving tray of the pediatric weighing scale, whereby both height and weight measurements of an infant may be carried out substantially simultaneously.

摘要翻译： 一种与儿科称重秤相结合的音量计。 漫射仪具有小儿尺度安装装置，其从其主框架向下突出，具有可释放的保持装置，用于可释放地将动物测量计保持在儿科秤上，其中，该计算机的婴儿接收托盘还用作儿科的婴儿接收托盘 称重秤，其中婴儿的高度和重量测量可以基本上同时进行。

公开(公告)号：US06284986B1

公开(公告)日：2001-09-04

申请号：US09270234

申请日：1999-03-15

申请人： Gerald R. Dietze ,  Oleg V. Kononchuk

发明人： Gerald R. Dietze ,  Oleg V. Kononchuk

IPC分类号： G01G1950

CPC分类号： G01G9/00 ,  G01B21/08 ,  H01L21/31604 ,  H01L21/32051 ,  H01L21/32055 ,  H01L22/12

摘要： A method of determining the thickness of a layer on a substrate where the layer is deposited during a semiconductor manufacturing process. The substrate is weighed a first time. The layer is deposited on the substrate and the substrate is weighed a second time. The thickness of the layer is calculated using the difference between the second weighing and the first weighing.

摘要翻译： 一种在半导体制造过程中确定层沉积的衬底上的层的厚度的方法。 首先称重基板。 该层沉积在衬底上，并且第二次称重衬底。 使用第二称重和第一称重之间的差来计算层的厚度。