LAYERED PIXEL DETECTOR OF IONIZING RADIATION
    1.
    发明申请
    LAYERED PIXEL DETECTOR OF IONIZING RADIATION 审中-公开
    层状像素探测器的电离辐射

    公开(公告)号:WO2017129151A1

    公开(公告)日:2017-08-03

    申请号:PCT/CZ2017/000001

    申请日:2017-01-24

    Applicant: ADVACAM S.R.O.

    Inventor: JAKŮBEK, Jan

    CPC classification number: G01T1/242 G01T1/247 G01T1/366

    Abstract: The layered pixel detector (7) of ionizing radiation includes at least two semiconductor pixel particle counting detectors. Each detector consists of a sensor (1) connected to a readout chip (2), while the readout chip (2) on a part of its perimeter has a projecting section (8) with contact pads to connect conductors (3). The detectors form at least one segment (9) in which the pixel detectors are arranged into layers on top of each other. The thickness of the readout chips (2) is up to 200 μm and the thickness of the sensors (1) is up to 2000 μm. The layered detector (7) includes at least one carrying thermal conductive platform (10) provided with at least one supporting structure (5) to support at least one projecting section (8) of the readout chip (2).

    Abstract translation: 电离辐射的分层像素检测器(7)包括至少两个半导体像素颗粒计数检测器。 每个检测器由连接到读出芯片(2)的传感器(1)组成,而读出芯片(2)在其周边的一部分上具有用于连接导体(3)的具有接触垫的突出部分(8)。 检测器形成至少一个区段(9),其中像素检测器被布置成层叠在彼此之上。 读出芯片(2)的厚度高达200μm,传感器(1)的厚度高达2000μm。 分层探测器(7)包括至少一个承载导热平台(10),其设有至少一个支撑结构(5)以支撑读出芯片(2)的至少一个突出部分(8)。

    A METHOD OF X-RAY NANO-RADIOGRAPHY AND NANOTOMOGRAPHY AND A DEVICE FOR EXECUTING THIS METHOD
    2.
    发明申请
    A METHOD OF X-RAY NANO-RADIOGRAPHY AND NANOTOMOGRAPHY AND A DEVICE FOR EXECUTING THIS METHOD 审中-公开
    一种用于执行该方法的X射线纳米放射学和纳米光刻技术的方法

    公开(公告)号:WO2016086908A1

    公开(公告)日:2016-06-09

    申请号:PCT/CZ2015/000145

    申请日:2015-12-03

    Applicant: ADVACAM s.r.o.

    Inventor: SOHAR, Jan

    CPC classification number: G01N23/046 G01N23/2251 G01N2223/045 G01N2223/419

    Abstract: The invention describes a method and a device (9) for executing a method of X-ray nano-radiography and nanotomography using a scanning electron microscope (1) consisting of the focus of an electron beam (2) from an electron microscope (1) onto one point of the surface of a scanned sample (3), the emission of bremsstrahlung and fluorescent radiation (6) from the focal point of the impact of the electron beam (2), the sensing of the scanned sample (3), and recording an image of the structure of the scanned sample (3) based on the change of intensities of the bremsstrahlung and fluorescent radiation (6) by the imaging detector (7) arranged behind the sample (3).

    Abstract translation: 本发明描述了使用由电子显微镜(1)的电子束(2)的焦点组成的扫描电子显微镜(1)来执行X射线纳米射线照相术和纳米成像方法的方法和装置(9) 在扫描样品(3)的表面的一个点上,从电子束(2)的冲击的焦点发射bre致辐射和荧光辐射(6),扫描样品(3)的感测和 基于由配置在样品(3)后面的成像检测器(7)基于bre致辐射强度和荧光辐射(6)的强度的变化记录扫描样品(3)的结构的图像。

    A METHOD OF DETECTION OF DEFECTS IN MATERIALS WITH INTERNAL DIRECTIONAL STRUCTURE AND A DEVICE FOR PERFORMANCE OF THE METHOD
    3.
    发明申请
    A METHOD OF DETECTION OF DEFECTS IN MATERIALS WITH INTERNAL DIRECTIONAL STRUCTURE AND A DEVICE FOR PERFORMANCE OF THE METHOD 审中-公开
    用内部方向结构检测材料缺陷的方法和方法性能的方法

    公开(公告)号:WO2017045657A1

    公开(公告)日:2017-03-23

    申请号:PCT/CZ2016/000102

    申请日:2016-09-14

    Applicant: ADVACAM S.R.O.

    CPC classification number: G01N23/18 G01N23/04 G01N23/2206

    Abstract: Problem to be resolved: Non-destructive detection of directional and other defects in structured materials that cannot be detected by current detection and imaging methods. Problem solution: The problem has been resolved by inclining the incident beam of ionizing radiation irradiating the examined object (3), while knowing the geometry of positions of the object (3), source (2) of beams ionizing radiation and detector (8), including the size of the angle of incidence (a). Based on detection of an attenuated or dispersed beam of ionizing radiation an image is obtained of directional defects in the material with internal structure.

    Abstract translation: 要解决的问题:无法通过当前检测和成像方法检测结构材料中的方向性和其他缺陷的无损检测。 问题解决方案:通过倾斜照射被检查物体(3)的电离辐射的入射光束,同时知道物体(3),光束电离辐射源(2)和检测器(8)的位置的几何形状已经解决了该问题, ,包括入射角的大小(a)。 基于对电离辐射的衰减或分散束的检测,获得具有内部结构的材料中的方向性缺陷的图像。

    IONIZING RADIATION DETECTOR MODULE
    4.
    发明申请
    IONIZING RADIATION DETECTOR MODULE 审中-公开
    离子辐射检测器模块

    公开(公告)号:WO2016180382A1

    公开(公告)日:2016-11-17

    申请号:PCT/CZ2016/000054

    申请日:2016-05-10

    Applicant: ADVACAM s.r.o.

    CPC classification number: G01T1/243 G01T1/244 G01T1/247

    Abstract: A module (1) for a detector (14) of ionizing radiation comprising at least two detection segments (2) for detecting ionizing radiation, attached to a row carrier (3) allowing for the assembly of detectors (14) with an unlimitedly large detection surface for continuous imaging of ionizing radiation. The construction of the module (1), including a means (10) for power supply stabilization for each detection segment (2), an interconnection of electrical conductors (8), formed by printed circuit boards (9, 13) led vertically downwards perpendicular to the detector surface along the row carrier (3), and a parallel connection to the connectors (11) of the read-out electronics, increases the reliability and speed of the operation of the detector (14). Between the individual parts of the module (1) there are formed thermal bridges to stabilize the temperature and to increase the reliability of the detector (14) assemblies from the modules (1).

    Abstract translation: 一种用于电离辐射的检测器(14)的模块(1),包括用于检测电离辐射的至少两个检测段(2),附接到行载体(3),允许以无限大的检测 表面用于电离辐射的连续成像。 模块(1)的结构包括用于每个检测段(2)的电源稳定装置(10),由印刷电路板(9,13)形成的电导体(8)的互连,垂直向下垂直 到行式载体(3)的检测器表面,并且与读出电子装置的连接器(11)的并联连接增加了检测器(14)的操作的可靠性和速度。 在模块(1)的各个部件之间形成有热桥以稳定温度并增加检测器(14)组件从模块(1)的可靠性。

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