Abstract:
The layered pixel detector (7) of ionizing radiation includes at least two semiconductor pixel particle counting detectors. Each detector consists of a sensor (1) connected to a readout chip (2), while the readout chip (2) on a part of its perimeter has a projecting section (8) with contact pads to connect conductors (3). The detectors form at least one segment (9) in which the pixel detectors are arranged into layers on top of each other. The thickness of the readout chips (2) is up to 200 μm and the thickness of the sensors (1) is up to 2000 μm. The layered detector (7) includes at least one carrying thermal conductive platform (10) provided with at least one supporting structure (5) to support at least one projecting section (8) of the readout chip (2).
Abstract:
The invention describes a method and a device (9) for executing a method of X-ray nano-radiography and nanotomography using a scanning electron microscope (1) consisting of the focus of an electron beam (2) from an electron microscope (1) onto one point of the surface of a scanned sample (3), the emission of bremsstrahlung and fluorescent radiation (6) from the focal point of the impact of the electron beam (2), the sensing of the scanned sample (3), and recording an image of the structure of the scanned sample (3) based on the change of intensities of the bremsstrahlung and fluorescent radiation (6) by the imaging detector (7) arranged behind the sample (3).
Abstract:
Problem to be resolved: Non-destructive detection of directional and other defects in structured materials that cannot be detected by current detection and imaging methods. Problem solution: The problem has been resolved by inclining the incident beam of ionizing radiation irradiating the examined object (3), while knowing the geometry of positions of the object (3), source (2) of beams ionizing radiation and detector (8), including the size of the angle of incidence (a). Based on detection of an attenuated or dispersed beam of ionizing radiation an image is obtained of directional defects in the material with internal structure.
Abstract:
A module (1) for a detector (14) of ionizing radiation comprising at least two detection segments (2) for detecting ionizing radiation, attached to a row carrier (3) allowing for the assembly of detectors (14) with an unlimitedly large detection surface for continuous imaging of ionizing radiation. The construction of the module (1), including a means (10) for power supply stabilization for each detection segment (2), an interconnection of electrical conductors (8), formed by printed circuit boards (9, 13) led vertically downwards perpendicular to the detector surface along the row carrier (3), and a parallel connection to the connectors (11) of the read-out electronics, increases the reliability and speed of the operation of the detector (14). Between the individual parts of the module (1) there are formed thermal bridges to stabilize the temperature and to increase the reliability of the detector (14) assemblies from the modules (1).