APPARATUS AND METHOD FOR TESTING ELECTRONIC EQUIPMENT
    1.
    发明申请
    APPARATUS AND METHOD FOR TESTING ELECTRONIC EQUIPMENT 审中-公开
    用于测试电子设备的装置和方法

    公开(公告)号:WO2013028634A3

    公开(公告)日:2014-05-08

    申请号:PCT/US2012051616

    申请日:2012-08-20

    发明人: ALBERT GLENN D

    IPC分类号: G01K1/14

    CPC分类号: G01R31/003

    摘要: A thermal wrap for testing electronic components has a web having an inside and an outside surface and a first end and a second end and a thermal element incorporated in said web. An edge element incorporated substantially along at least one edge of said web promotes a thermal seal between said web and the electronic component being tested when the electronic component in installed in the wrap. A closure disposed on the ends may be reversibly closed sufficiently tightly to promote the thermal seal.

    摘要翻译: 用于测试电子部件的热包装具有带有内表面和外表面的网,并且第一端和第二端以及并入所述网中的热元件。 基本上沿着所述网的至少一个边缘并入的边缘元件在安装在包装中的电子部件时促进所述卷材和正被测试的电子部件之间的热密封。 设置在端部上的封闭件可以被充分紧密地可逆地封闭以促进热封。

    APPARATUS AND METHOD FOR TESTING ELECTRONIC EQUIPMENT
    2.
    发明申请
    APPARATUS AND METHOD FOR TESTING ELECTRONIC EQUIPMENT 审中-公开
    用于测试电子设备的装置和方法

    公开(公告)号:WO2013028634A2

    公开(公告)日:2013-02-28

    申请号:PCT/US2012/051616

    申请日:2012-08-20

    发明人: ALBERT, Glenn, D.

    IPC分类号: G01R1/00

    CPC分类号: G01R31/003

    摘要: A thermal wrap for testing electronic components has a web having an inside and an outside surface and a first end and a second end and a thermal element incorporated in said web. An edge element incorporated substantially along at least one edge of said web promotes a thermal seal between said web and the electronic component being tested when the electronic component in installed in the wrap. A closure disposed on the ends may be reversibly closed sufficiently tightly to promote the thermal seal.

    摘要翻译: 用于测试电子部件的热包装具有带有内表面和外表面的网,并且第一端和第二端以及并入所述网中的热元件。 基本上沿着所述网的至少一个边缘并入的边缘元件在安装在包装中的电子部件时促进所述卷材和正被测试的电子部件之间的热密封。 设置在端部上的封闭件可以被充分紧密地可逆地封闭以促进热封。