摘要:
A liquid dispenser for dispensing an effluent mixture comprises a manifold inlet connectable to a pressurized liquid source, at least one individual diluent outlet in fluid communication with the manifold inlet, and at least one backflow preventer and eductor system in fluid communication with the at least one individual diluent outlet. A flow regulator is in fluid communication with the at least one individual diluent outlet and the at least one backflow preventer and eductor system, located upstream of the at least one backflow preventer and eductor system and downstream of the at least one individual diluent outlet. The flow regulator is preferably individualized for the at least one backflow preventer and eductor system and interchangeable within the dispenser to facilitate a plurality of volumetric flow rates to the at least one respective backflow preventer and eductor system.
摘要:
A high-flow liquid dispenser comprises a diluent inlet connectable to a pressurized liquid source and a backflow preventer and eductor system in fluid commimication with the diluent inlet and defining a dispenser outlet for dispensing the effluent mixture, The backflow preventer and eductor system comprises at least two air gap or safe gap eductors in simultaneous fluid communication with the diluent inlet.
摘要:
The present invention provides for characterization of a film (e.g., thickness determination for a silicon oxynitride film) using a comparison process (e.g., a fitting process) to compare measured peak shapes for elemental and/or chemical species (e.g., Si peak shapes previously measured for a particular process to be monitored) to collected spectral data (e.g., using a non-linear least squares fitting algorithm). Further, the present invention provides for characterization of a film (e.g., thickness determination for a silicon oxynitride film) using collected spectral data. For example, an acquired spectrum may be cumulatively integrated and the geometric properties of the integrated spectrum may be used to determine component concentration information. Thickness measurements for the film may be provided based on the component concentration information.
摘要:
A liquid dispenser for dispensing an effluent mixture comprises a manifold inlet connectable to a pressurized liquid source, at least one individual diluent outlet in fluid communication with the manifold inlet, and at least one backflow preventer and eductor system in fluid communication with the at least one individual diluent outlet. A flow regulator is in fluid communication with the at least one individual diluent outlet and the at least one backflow preventer and eductor system, located upstream of the at least one backflow preventer and eductor system and downstream of the at least one individual diluent outlet. The flow regulator is preferably individualized for the at least one backflow preventer and eductor system and interchangeable within the dispenser to facilitate a plurality of volumetric flow rates to the at least one respective backflow preventer and eductor system.
摘要:
A system and method for acquisition of mass spectrometry data is configured to provide a stream of charged particles (e.g., from an analytical volume). A primary mass spectrometer (e.g., time-of-flight mass spectrometer) may be used to separate charged particles of the stream of charged particles based on their mass-to-charge ratio and detect the charged particles in a mass-to-charge spectrum. A stream of precursor ions having a selected mass range may be diverted from the stream of charged particles for fragmentation to provide fragment ions (e.g., fragment ions from the analytical volume). The fragment ions may be provided to a second mass spectrometer for analysis of the fragment ions (e.g., during the same time as the time- of-flight mass spectrometer is separating and detecting charged particles of the stream of charged particles based on their mass-to-charge ratio).
摘要:
Thrs invention relates generally to the dispensing of a fluid. More specifically, the invention relates to an apparatus and method for remotely controlling the flow of an effluent fluid stream from a dispensing hose of a fluid dispenser. An actuator controls at least one valve assembly of the fluid dispenser and comprises a generator located remotely of the at least one valve assembly, for generating a low-pressure signal, and at least one receiver in fluid communication with the generator for receiving the low pressure signal of each receiver operabiy associated with each valve assembly. The actuator also facilitates the simultaneous, sequential and alternate control of the at least one valve assembly.
摘要:
A dispensing assembly for dispensing a mixture of fluids is provided. In some embodiments, the dispensing assembly includes a first valve for selectively permitting fluid flow to a mixing chamber in which a second fluid is introduced, wherein the valve is actuated between open and closed positions responsive to fluid pressure downstream of the mixing chamber. In such embodiments, the fluid pressure downstream of the mixing chamber can change based upon whether fluid is dispensed from a spray gun, wand, nozzle, or other dispensing head of the dispensing assembly.
摘要:
A dispensing assembly for dispensing a mixture of fluids is provided. In some embodiments, the dispensing assembly includes a first valve for selectively permitting fluid flow to a mixing chamber in which a second fluid is introduced, wherein the valve is actuated between open and closed positions responsive to fluid pressure downstream of the mixing chamber. In such embodiments, the fluid pressure downstream of the mixing chamber can change based upon whether fluid is dispensed from a spray gun, wand, nozzle, or other dispensing head of the dispensing assembly.
摘要:
A sample holder apparatus and method for reducing the energy of charged particles entering an annular-acceptance analyzer includes use of an electrically isolated sample support member having a sample receiving surface configured to receive a sample and electrically connect the sample to the sample support member (e.g., wherein the sample support member is configured for application of a retarding bias potential). A grounded sample aperture member defining an aperture relative to the sample support member but electrically isolated therefrom is provided such that the aperture is proximate the sample receiving surface to expose at least a portion of a surface of a sample received thereon to be analyzed (e.g., wherein applying a retarding bias potential to the sample support member produces an electrical retarding field about the aperture that reduces the energy of emitted particles from a sample before they enter an annular-acceptance analyzer).
摘要:
Characterization of a sample, e.g., a depth profile, may be attained using one or more of the following parameters in an electron spectroscopy method or system. The one or more parameters may include using low ion energy ions for removing material from the sample to expose progressively deeper layers of the sample, using an ion beam having a low ion angle to perform such removal of sample material, and/or using an analyzer positioned at a high analyzer angle for receiving photoelectrons escaping from the sample as a result of x-rays irradiating the sample. Further, a correction algorithm may be used to determine the concentration of components (e.g., elements and/or chemical species) versus depth within the sample, e.g., thin film formed on a substrate. Such concentration determination may include calculating the concentration of components (e.g, elements and/or chemical species) at each depth of a depth profile by removing from depth profile data collected at a particular depth (i.e., the depth for which concentration is to be calculated) concentration contributions attributable to deeper depths of the sample. In addition, characterization of a sample, e.g., determination of a component's concentration in a thin film, may be attained by providing calibration information representative of surface spectrum measurements for a plurality of samples correlated with depth profile information for the plurality of samples. At least one characteristic of the sample to be characterized (e.g., concentration of a component) is determined based on one or more surface spectrum measurements for the sample to be characterized and the calibration information.