公开(公告)号：WO2004114586A1

公开(公告)日：2004-12-29

申请号：PCT/EP2004/050589

申请日：2004-04-22

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION ,  IBM DEUTSCHLAND GMBH ,  ALVAREZ DIEZ, Adrian ,  MIELKE, Frank Leo

Inventor： ALVAREZ DIEZ, Adrian ,  MIELKE, Frank Leo

IPC: H04L9/32

CPC classification number: H04L63/0823 ,  H04L63/12 ,  H04L67/10

Abstract: The present invention discloses a method and system for authenticating third tier servers in a distributed application environment by using a central procedure for recognizing and managing third tier server certificates at the client system side. Third tier server certificates which have been accepted by the central procedure are stored in a common database of the distributed application environment and the client system transmits via a secure connection to the server systems all necessary information of said third tier server certificates being accepted as trustworthy for determining to accept or to decline a third tier server. In a preferred embodiment of the present invention only fingerprints of third tier server certificates being accepted as trustworthy together with server name which has transmitted said third tier server certificate, and certificate name are transferred via a secure connection to the server systems of the distributed application environment.

Abstract translation: 本发明公开了一种在分布式应用环境中通过使用用于在客户端系统侧识别和管理第三层服务器证书的中央过程来认证第三层服务器的方法和系统。 中央程序接受的第三层服务器证书存储在分布式应用程序环境的公共数据库中，客户端系统通过安全连接传输到服务器系统，所有第三层服务器证书的所有必要信息被接受为可信赖的 确定接受或拒绝第三层服务器。 在本发明的优选实施例中，只有第三层服务器证书的指纹被接受为可信赖的服务器名称以及已经发送所述第三层服务器证书的服务器名称，并且证书名称经由安全连接传送到分布式应用环境的服务器系统 。

公开(公告)号：WO2022161631A1

公开(公告)日：2022-08-04

申请号：PCT/EP2021/052190

申请日：2021-01-29

Applicant: ADVANTEST CORPORATION ,  MIELKE, Frank

Inventor： MIELKE, Frank

IPC: G01R31/3185 ,  G01R31/3187 ,  G01R31/319 ,  G01R33/02

Abstract: The invention describes an integrated circuit, comprising a functional circuit structure which is configured to provide a functionality; and a test structure configured to set a signal, which is coupled to the functional circuit structure, to a test value in response to a magnetic field impulse, to control a test of the integrated circuit. The invention also describes an apparatus and a method for testing an integrated circuit and a computer program implementing the method. This invention provides a time-effective and cost-effective concept of component testing using magnetic interaction.

公开(公告)号：WO2022161629A1

公开(公告)日：2022-08-04

申请号：PCT/EP2021/052188

申请日：2021-01-29

Applicant: ADVANTEST CORPORATION ,  MIELKE, Frank

Inventor： MIELKE, Frank

IPC: G01R31/319 ,  G01R31/3187 ,  G01R31/3185 ,  G01R33/02

Abstract: The invention describes an apparatus (100) for testing a component, wherein the apparatus (100) is configured to apply (101), for a set of B-field orientations, a magnetic B-field with a B-field orientation from the set of B-field orientations to the component; and wherein the apparatus (100) is configured to perform (102) a test of the component in the presence of the respective magnetic B-fields, to obtain an information characterizing an operation of the component; and wherein the apparatus (100) is configured to determine (103) a test result on the basis of the information characterizing the operation of the component associated with different magnetic B-fields. The invention also describes a method of testing and a computer program implementing the method. A test arrangement comprising the apparatus for testing is also described. This invention provides a testing concept, which is more efficient in view of the reliability and the costs.