MEASURING APPARATUS FOR PERFORMING POSITIONAL ANALYSIS ON AN INTEGRATED CIRCUIT CARRIER
    1.
    发明申请
    MEASURING APPARATUS FOR PERFORMING POSITIONAL ANALYSIS ON AN INTEGRATED CIRCUIT CARRIER 审中-公开
    用于在集成电路载体上执行位置分析的测量装置

    公开(公告)号:WO2010019980A1

    公开(公告)日:2010-02-25

    申请号:PCT/AU2008/001194

    申请日:2008-08-19

    CPC classification number: G01B11/002 G06T7/73 G06T2207/30108 G06T2207/30204

    Abstract: The invention relates to a measuring apparatus. The apparatus includes a housing assembly that defines an enclosure, a control system mounted in the housing assembly, and an operator interface mounted on the housing assembly and connected to the control system to allow an operator to control the measuring apparatus. The apparatus also includes a measuring table assembly mounted in the housing assembly and configured to receive a nest assembly supporting an integrated circuit carrier carrying a number of integrated circuits, and a camera assembly mounted in the housing assembly and configured to generate image data representing the integrated circuit carrier and the integrated circuits. The camera assembly is connected to the control system which is configured to carry out a positional analysis on the integrated circuit carrier and the integrated circuits to determine at least one of positions of the integrated circuits on the carrier and relative positions of consecutive integrated circuits.

    Abstract translation: 本发明涉及一种测量装置。 该装置包括限定外壳的外壳组件,安装在外壳组件中的控制系统以及安装在壳体组件上并连接到控制系统以允许操作者控制测量装置的操作者界面。 该装置还包括安装在壳体组件中并被配置为接收支撑携带多个集成电路的集成电路载体的嵌套组件的测量台组件,以及安装在壳体组件中并被配置为生成表示集成的图像数据的图像数据 电路载体和集成电路。 相机组件连接到控制系统,其被配置为对集成电路载体和集成电路执行位置分析,以确定载体上的集成电路的位置和连续集成电路的相对位置中的至少一个。

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