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公开(公告)号：WO2013093459A2
公开(公告)日：2013-06-27
申请号：PCT/GB2012/053187
申请日：2012-12-19
Applicant: TAYLOR HOBSON LIMITED , RAYER, Mathieu
Inventor： RAYER, Mathieu
CPC classification number: G01J3/0262 , G01B11/026 , G01B11/303 , G01B11/306 , G01B2210/50 , G02B21/0064
Abstract: Metrological apparatus and a confocal sensor for use in such apparatus are described. The confocal sensor (1) has an optical pinhole (1 1) adapted for letting through a light beam (2). An optical assembly of the sensor has a first lens (12) having a refractive profile (121) and a diffractive profile (122) and a second lens (13) having at least a refractive profile (131). The refractive profile (121) of the first lens (12) and the refractive profile (131) of the second lens (13) focus the light beam (2) into a focused beam (21 ). The diffractive profile (122) of the first lens (12) creates longitudinal chromatic aberration so that the focused beam (21) has a focal zone with a longitudinal depth (R).
Abstract translation: 描述了用于这种装置的计量装置和共聚焦传感器。 共聚焦传感器（1）具有适于穿过光束（2）的光学针孔（11）。 传感器的光学组件具有具有折射轮廓（121）和衍射轮廓（122）的第一透镜（12）和至少具有折射轮廓（131）的第二透镜（13）。 第一透镜（12）的折射轮廓（121）和第二透镜（13）的折射轮廓（131）将光束（2）聚焦成聚焦光束（21）。 第一透镜（12）的衍射轮廓（122）产生纵向色差，使得聚焦光束（21）具有纵向深度（R）的聚焦区域。
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公开(公告)号：WO2014080207A3
公开(公告)日：2014-12-24
申请号：PCT/GB2013053075
申请日：2013-11-21
Applicant: TAYLOR HOBSON LTD , RAYER MATHIEU
Inventor： RAYER MATHIEU
CPC classification number: G01M11/0242 , B24B13/06 , G01M11/02 , G01M11/0221 , G02B3/0025 , G02B5/1895 , G02B27/4211 , G05B2219/36063 , Y02P90/265
Abstract: In one aspect the invention relates to an apparatus for analysing at least one measured optical profile of a machined workpiece, the apparatus comprising: an analysis module configured to: receive nominal optical profile data representing a desired profile of a workpiece as designed in a current design step; receive a plurality of measured optical profile data corresponding to a plurality of machined workpieces; for each measured optical profile data, determine a difference between the measured optical profile data and the nominal optical profile data; remove non-systematic machining errors from the determined difference, by determining an average of the plurality of determined differences; and output the determined average, corresponding to errors on the profile due to machining which are systematic machining errors, to a design module, in order to enable the design module to take into account the systematic machining errors in a further design step of the desired workpiece.
Abstract translation: 在一个方面中，本发明涉及一种用于分析机加工工件的至少一个测量的光学轮廓的设备，该设备包括：分析模块，其被配置为：接收表示如在当前设计中设计的工件的期望轮廓的标称光学轮廓数据 步; 接收对应于多个加工工件的多个测量的光学轮廓数据; 对于每个测量的光学轮廓数据，确定所测量的光学轮廓数据和标称光学轮廓数据之间的差异; 通过确定多个确定的差值的平均值，从所确定的差值中去除非系统加工误差; 并将对应于作为系统加工误差的加工的简档上的误差的所确定的平均值输出到设计模块，以便使设计模块能够在所需工件的另一设计步骤中考虑到系统加工误差 。
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公开(公告)号：WO2014080207A2
公开(公告)日：2014-05-30
申请号：PCT/GB2013/053075
申请日：2013-11-21
Applicant: TAYLOR HOBSON LIMITED , RAYER, Mathieu
Inventor： RAYER, Mathieu
IPC: G01M11/02
CPC classification number: G01M11/0242 , B24B13/06 , G01M11/02 , G01M11/0221 , G02B3/0025 , G02B5/1895 , G02B27/4211 , G05B2219/36063 , Y02P90/265
Abstract: In one aspect the invention relates to an apparatus for analysing at least one measured optical profile of a machined workpiece, the apparatus comprising: an analysis module configured to: receive nominal optical profile data representing a desired profile of a workpiece as designed in a current design step; receive a plurality of measured optical profile data corresponding to a plurality of machined workpieces; for each measured optical profile data, determine a difference between the measured optical profile data and the nominal optical profile data; remove non-systematic machining errors from the determined difference, by determining an average of the plurality of determined differences; and output the determined average, corresponding to errors on the profile due to machining which are systematic machining errors, to a design module, in order to enable the design module to take into account the systematic machining errors in a further design step of the desired workpiece.
Abstract translation: 一方面，本发明涉及一种用于分析加工的工件的至少一个测量的光学轮廓的装置，该装置包括：分析模块，其被配置为：接收表示当前设计中设计的工件的期望轮廓的标称光学轮廓数据 步; 接收对应于多个加工的工件的多个测量光学轮廓数据; 对于每个测量的光学轮廓数据，确定所测量的光学轮廓数据和标称光学轮廓数据之间的差异; 通过确定多个确定的差的平均值，从所确定的差异中去除非系统加工误差; 并且将对应于由于由于加工而导致的轮廓上的误差的确定的平均值输出到设计模块，以使设计模块能够在所需工件的另外的设计步骤中考虑系统加工误差 。
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公开(公告)号：WO2013093459A3
公开(公告)日：2014-01-09
申请号：PCT/GB2012053187
申请日：2012-12-19
Applicant: TAYLOR HOBSON LTD , RAYER MATHIEU
Inventor： RAYER MATHIEU
CPC classification number: G01J3/0262 , G01B11/026 , G01B11/303 , G01B11/306 , G01B2210/50 , G02B21/0064
Abstract: Metrological apparatus and a confocal sensor for use in such apparatus are described. The confocal sensor (1) has an optical pinhole (1 1) adapted for letting through a light beam (2). An optical assembly of the sensor has a first lens (12) having a refractive profile (121) and a diffractive profile (122) and a second lens (13) having at least a refractive profile (131). The refractive profile (121) of the first lens (12) and the refractive profile (131) of the second lens (13) focus the light beam (2) into a focused beam (21 ). The diffractive profile (122) of the first lens (12) creates longitudinal chromatic aberration so that the focused beam (21) has a focal zone with a longitudinal depth (R).
Abstract translation: 描述了用于这种装置的计量装置和共聚焦传感器。 共聚焦传感器（1）具有适于穿过光束（2）的光学针孔（11）。 传感器的光学组件具有具有折射轮廓（121）和衍射轮廓（122）的第一透镜（12）和至少具有折射轮廓（131）的第二透镜（13）。 第一透镜（12）的折射轮廓（121）和第二透镜（13）的折射轮廓（131）将光束（2）聚焦成聚焦光束（21）。 第一透镜（12）的衍射轮廓（122）产生纵向色差，使得聚焦光束（21）具有纵向深度（R）的聚焦区域。
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